SLVK146 august   2023 TPS7H2211-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H2211-SEP eFuse
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A
  15.   B References

Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the TPS7H2211-SEP. Heavy-ions with LETEFF (Effective Linear Energy Transfer) of 48 MeV·cm2/mg were used to irradiate 5 devices. A flux of ≈ 105 ions/(cm2·s) and fluence of ≈ 107 ions/cm2 per run were used for the characterization. The results demonstrated that the TPS7H2211-SEP is single event latch-up, single-event burnout and single-event gate rupture (EN = high/low)-free at T = 125°C and 25°C, respectively, using 109Ag across the full electrical specifications. A single transient was not observed. See Section 8 for more details.