SLVK164 December   2023 TPS7H2211-SP

PRODUCTION DATA  

  1.   1
  2.   Trademarks
  3. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  4. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  5. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 TPS7H2211-QMLP Datasheet Electrical Parameters
  6. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  7.   A Appendix: HDR TID Report Data

1.2 Device Details

Table 1-1 lists the device information used in the TID HDR characterization.

Table 1-1 Device and Exposure Details
TID HDR Details: up to 100 krad(Si)
TI Device NumberTPS7H2211-QLMP
Package32-pin HTSSOP (DAP)
TechnologyLinear BiCMOS 7 (LBC7)
Die Lot Number1203077
A/T Lot Number and Date Code3412486/B35CN5FK
Quantity Tested50 irradiated units
Lot Accept or RejectAll levels tested and passed up to 100 krad(Si)
HDR Radiation FacilityDCLAB - Texas Instruments, Dallas, TX
HDR Dose Level3 krad(Si), 10 krad(Si), 30 krad(Si),

50 krad(Si) and 100 krad(Si)

HDR Dose Rate200 rad/s
HDR Radiation SourceGammacell 220 Excel (GC-220E) Co-60
Irradiation TemperatureAmbient, room temperature
GUID-77CB4542-10CA-4A3C-8D61-76E54B98A6F6-low.pngFigure 1-1 Device Used in Exposure (Front)
GUID-4B113ADA-33F8-4878-A4D1-C0E2D6F2C87E-low.pngFigure 1-2 Device Used in Exposure (Back)