SLVK182 December   2024 DRV8351-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix: HDR TID Report Data
  9. 6Appendix: ELDRS TID Report Data

Abstract

This report discusses the radiation characterization results of the DRV8351-SEP. The study was done to determine total ionizing dose (TID) effects under high dose rate (HDR) up to 30krad(Si) as a one time characterization. The results show that all samples passed within the specified limits up to 30krad(Si). Radiation Lot Acceptance Testing (RLAT) are performed using five units at a dose level of 30krad(Si) for future wafer lots per MIL-STD-883 TM 1019.

The DRV8351-SEP is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43MeV-cm2 / mg, which makes the device an option for low Earth orbit space applications.

The DRV8351-SEP Total Ionizing Dose (TID) Report covers the TID performance.