SLVUCG6 November 2022 TPS650350-Q1
The TPS650350-Q1 EVM contains 29 test points for various measurements. Trace assignments to the test points are shown in Table 5-1. For reference, Figure 5-1 demonstrates the test point locations on the EVM.
Test Point Number | Associated Trace |
---|---|
TP1 | GND |
TP2 | GND |
TP3 | GND |
TP4 | VIN |
TP5 | GND |
TP6 | VSYS/PVIN_B1 |
TP7 | GND |
TP8 | GND |
TP9 | GND |
TP10 | VBUCK1 |
TP11 | VBUCK2 |
TP12 | VBUCK3 |
TP13 | VLDO |
TP14 | GND |
TP15 | PVIN_B2/PVINLDO |
TP16 | PVIN_B3 |
TP17 | VIO |
TP18 | VREG |
TP19 | V1P8_INT |
TP20 | SEQ |
TP21 | SDA |
TP22 | SCL |
TP23 | nRST |
TP24 | nINT |
TP25 | GPIO (PMIC) |
TP26 | VBUS |
TP27 | GND |
J16 | PVIN_B2/PVINLDO |
J17 | VLDO |