SPNA249 june   2023 TMS570LC4357-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2SEE Mechanisms
  6. 3Test Device Information
  7. 4Irradiation Facility and Setup
  8. 5SEL Results
  9. 6Summary
  10.   References

Abstract

The purpose of this study is to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the TMS570LC4357-SEP, Arm® Cortex®-R based microcontroller. Heavy-ions with an LETeff of 48 MeV-cm2/mg were used to irradiate the devices with a fluence of 1 x 107 ions/cm2. The results demonstrate that TMS570LC4357-SEP is SEL-free up to LETeff of 48 MeV-cm2/mg at 125°C.