SPNA249 june   2023 TMS570LC4357-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2SEE Mechanisms
  6. 3Test Device Information
  7. 4Irradiation Facility and Setup
  8. 5SEL Results
  9. 6Summary
  10.   References

1 Introduction

The TMS570LC4357-SEP is a high-performance Arm Cortex-R based microcontroller which has on-chip diagnostic features including: dual CPUs in lockstep, Built-In Self-Test (BIST) logic for CPU, the N2HET coprocessors, and for on-chip SRAMs; ECC protection on the L1 caches, L2 flash, and SRAM memories. The device also supports ECC or parity protection on peripheral memories and loopback capability on peripheral I/Os.

The device integrates two Arm Cortex-R5F floating-point CPUs, operating in lockstep, which offer an efficient 1.66 DMIPS/MHz, and can run up to 300 MHz providing up to 498 DMIPS. The device supports the big-endian [BE32] format.

With integrated safety features and a wide choice of communication and control peripherals, the TMS570LC4357-SEP device is an ideal solution for high-performance real-time control applications with safety critical requirements

https://www.ti.com/product/TMS570LC4357

Table 1-1 Overview Information (1)
Description Device Information
TI Part Number TMS570LC4357-SEP
Device Function Arm Cortex-R based microcontroller
Package 337 GWT (nFBGA)
Technology 12F021.M7C
Exposure Facility Radiation Effect Facility, Cyclotron Institute, Texas A&M University
Heavy Ion Fluence per Run 1 x 106 - 1 x 107 ions/cm2
Irradiation Temperature 125°C (for SEL testing)
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