SPRACN0F October 2021 – March 2023 F29H850TU , F29H859TU-Q1 , TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384S , TMS320F28386D , TMS320F28386S , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1
Fault detection and reaction is important in most systems, not only for avoiding an undefined output, but for preventing damage to components both on and off the main Printed Circuit Board (PCB). The speed at which the fault detection takes place, as well as the final FET output state change, is critical to the system. A dedicated subsystem that ties together the analog and digital domains has been implemented on the C2000 MCU for handling this requirement: the Comparator Subsystem or CMPSS (#T5843526-91).
There are up to eight CMPSS modules on each C2000 MCU, with internal DACs that give the inverting/comparison detection level for the line that is being monitored. As shown in #T5843526-91, each CMPSS module has two comparators for simultaneous high and low detection. Using the CMPSS has several advantages over using the ADC for fault detection:
Sampling Method | Sample Time (min) | Result Ready (min) | Latch and Change PWM Pin (@200 MHz SysClk) | Total Time From Fault To Trip |
---|---|---|---|---|
12-bit ADC | 75 ns | 260 ns | approximately 100 ns(inc ISR) | 435 ns |
12-bit ADC w/PPB | 75 ns | 260 ns | 10 ns | 355 ns |
CMPSS | NA | NA | NA | 60 ns |