SPRACN0F October   2021  – March 2023 F29H850TU , F29H859TU-Q1 , TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384S , TMS320F28386D , TMS320F28386S , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.    The Essential Guide for Developing With C2000™ Real-Time Microcontrollers
  2.   Trademarks
  3. 1C2000 and Real-Time Control
    1. 1.1 Getting Started Resources
    2. 1.2 Processing
    3. 1.3 Control
    4. 1.4 Sensing
    5. 1.5 Interface
    6. 1.6 Functional Safety
  4. 2Sensing Key Technologies
    1. 2.1 Accurate Digital Domain Representation of Analog Signals
      1. 2.1.1 Value Proposition
      2. 2.1.2 In Depth
      3. 2.1.3 Device List
      4. 2.1.4 Hardware Platforms and Software Examples
      5. 2.1.5 Documentation
    2. 2.2 Optimizing Acquisition Time vs Circuit Complexity for Analog Inputs
      1. 2.2.1 Value Proposition
      2. 2.2.2 In Depth
      3. 2.2.3 Device List
      4. 2.2.4 Hardware Platforms and Software Examples
      5. 2.2.5 Documentation
    3. 2.3 Hardware Based Monitoring of Dual-Thresholds Using a Single Pin Reference
      1. 2.3.1 Value Proposition
      2. 2.3.2 In Depth
      3. 2.3.3 Device List
      4. 2.3.4 Hardware Platforms and Software Examples
      5. 2.3.5 Documentation
    4. 2.4 Resolving Tolerance and Aging Effects During ADC Sampling
      1. 2.4.1 Value Proposition
      2. 2.4.2 In Depth
      3. 2.4.3 Device List
      4. 2.4.4 Hardware Platforms and Software Examples
      5. 2.4.5 Documentation
    5. 2.5 Realizing Rotary Sensing Solutions Using C2000 Configurable Logic Block
      1. 2.5.1 Value Proposition
      2. 2.5.2 In Depth
      3. 2.5.3 Device List
      4. 2.5.4 Hardware Platforms and Software Examples
      5. 2.5.5 Documentation
    6. 2.6 Smart Sensing Across An Isolation Boundary
      1. 2.6.1 Value Proposition
      2. 2.6.2 In Depth
      3. 2.6.3 Device List
      4. 2.6.4 Hardware Platforms and Software Examples
      5. 2.6.5 Documentation
    7. 2.7 Enabling Intra-Period Updates in High Bandwidth Control Topologies
      1. 2.7.1 Value Proposition
      2. 2.7.2 In Depth
      3. 2.7.3 Device List
      4. 2.7.4 Hardware Platforms and Software Examples
      5. 2.7.5 Documentation
    8. 2.8 Accurate Monitoring of Real-Time Control System Events Without the Need for Signal Conditioning
      1. 2.8.1 Value Proposition
      2. 2.8.2 In Depth
      3. 2.8.3 Device List
      4. 2.8.4 Hardware Platforms and Software Examples
      5. 2.8.5 Documentation
  5. 3Processing Key Technologies
    1. 3.1 Accelerated Trigonometric Math Functions
      1. 3.1.1 Value Proposition
      2. 3.1.2 In Depth
      3. 3.1.3 Device List
      4. 3.1.4 Hardware Platforms and Software Examples
      5. 3.1.5 Documentation
    2. 3.2 Fast Onboard Integer Division
      1. 3.2.1 Value Proposition
      2. 3.2.2 In Depth
      3. 3.2.3 Device List
      4. 3.2.4 Hardware Platforms and Software Platforms
      5. 3.2.5 Documentation
    3. 3.3 Hardware Support for Double-Precision Floating-Point Operations
      1. 3.3.1 Value Proposition
      2. 3.3.2 In Depth
      3. 3.3.3 Device List
      4. 3.3.4 Hardware Platforms and Software Examples
      5. 3.3.5 Documentation
    4. 3.4 Increasing Control Loop Bandwidth With An Independent Processing Unit
      1. 3.4.1 Value Proposition
      2. 3.4.2 In Depth
      3. 3.4.3 Device List
      4. 3.4.4 Hardware Platforms and Software Examples
      5. 3.4.5 Documentation
    5. 3.5 Flexible System Interconnect: C2000 X-Bar
      1. 3.5.1 Value Proposition
      2. 3.5.2 In Depth
      3. 3.5.3 Device List
      4. 3.5.4 Hardware Platforms and Software Examples
      5. 3.5.5 Documentation
    6. 3.6 Improving Control Performance With Nonlinear PID Control
      1. 3.6.1 Value Proposition
      2. 3.6.2 In Depth
      3. 3.6.3 Device List
      4. 3.6.4 Hardware Platforms and Software Examples
      5. 3.6.5 Documentation
    7. 3.7 Understanding Flash Memory Performance In Real-Time Control Applications
      1. 3.7.1 Value Proposition
      2. 3.7.2 In Depth
      3. 3.7.3 Device List
      4. 3.7.4 Hardware Platforms and Software Examples
      5. 3.7.5 Documentation
    8. 3.8 Deterministic Program Execution With the C28x DSP Core
      1. 3.8.1 Value Proposition
      2. 3.8.2 In Depth
      3. 3.8.3 Device List
      4. 3.8.4 Hardware Platforms and Software Examples
      5. 3.8.5 Documentation
    9. 3.9 Efficient Live Firmware Updates (LFU) and Firmware Over-The-Air (FOTA) updates
      1. 3.9.1 Value Proposition
      2. 3.9.2 In Depth
      3. 3.9.3 Device List
      4. 3.9.4 Hardware Platforms and Software Examples
      5. 3.9.5 Documentation
  6. 4Control Key Technologies
    1. 4.1 Reducing Limit Cycling in Control Systems With C2000 HRPWMs
      1. 4.1.1 Value Proposition
      2. 4.1.2 In Depth
      3. 4.1.3 Device List
      4. 4.1.4 Hardware Platforms and Software Examples
      5. 4.1.5 Documentation
    2. 4.2 Shoot Through Prevention for Current Control Topologies With Configurable Deadband
      1. 4.2.1 Value Proposition
      2. 4.2.2 In Depth
      3. 4.2.3 Device List
      4. 4.2.4 Documentation
    3. 4.3 On-Chip Hardware Customization Using the C2000 Configurable Logic Block
      1. 4.3.1 Value Proposition
      2. 4.3.2 In Depth
      3. 4.3.3 Device List
      4. 4.3.4 Hardware Platforms and Software Examples
      5. 4.3.5 Documentation
    4. 4.4 Fast Detection of Over and Under Currents and Voltages
      1. 4.4.1 Value Proposition
      2. 4.4.2 In Depth
      3. 4.4.3 Device List
      4. 4.4.4 Hardware Platforms and Software Examples
      5. 4.4.5 Documentation
    5. 4.5 Improving System Power Density With High Resolution Phase Control
      1. 4.5.1 Value Proposition
      2. 4.5.2 In Depth
      3. 4.5.3 Device List
      4. 4.5.4 Hardware Platforms and Software Examples
      5. 4.5.5 Documentation
    6. 4.6 Safe and Optimized PWM Updates in High-Frequency, Multi-Phase and Variable Frequency Topologies
      1. 4.6.1 Value Proposition
      2. 4.6.2 In Depth
      3. 4.6.3 Device List
      4. 4.6.4 Hardware Platforms and Software Examples
      5. 4.6.5 Documentation
    7. 4.7 Solving Event Synchronization Across Multiple Controllers in Decentralized Control Systems
      1. 4.7.1 Value Proposition
      2. 4.7.2 In Depth
      3. 4.7.3 Device List
      4. 4.7.4 Hardware Platforms and Software Examples
      5. 4.7.5 Documentation
  7. 5Interface Key Technologies
    1. 5.1 Direct Host Control of C2000 Peripherals
      1. 5.1.1 Value Proposition
      2. 5.1.2 In Depth
        1. 5.1.2.1 HIC Bridge for FSI Applications
        2. 5.1.2.2 HIC Bridge for Position Encoder Applications Using CLB
      3. 5.1.3 Device List
      4. 5.1.4 Hardware Platforms and Software Examples
      5. 5.1.5 Documentation
    2. 5.2 Securing External Communications and Firmware Updates With an AES Engine
      1. 5.2.1 Value Proposition
      2. 5.2.2 In Depth
      3. 5.2.3 Device List
      4. 5.2.4 Hardware Platforms and Software Examples
      5. 5.2.5 Documentation
    3. 5.3 Distributed Real-Time Control Across an Isolation Boundary
      1. 5.3.1 Value Proposition
      2. 5.3.2 In Depth
      3. 5.3.3 Device List
      4. 5.3.4 Hardware Platforms and Software Examples
      5. 5.3.5 Documentation
    4. 5.4 Custom Tests and Data Pattern Generation Using the Embedded Pattern Generator (EPG)
      1. 5.4.1 Value Proposition
      2. 5.4.2 In Depth
      3. 5.4.3 Device List
      4. 5.4.4 Hardware Platforms and Software Examples
      5. 5.4.5 Documentation
  8. 6Safety Key Technologies
    1. 6.1 Non-Intrusive Run Time Monitoring and Diagnostics as Part of the Control Loop
      1. 6.1.1 Value Proposition
      2. 6.1.2 In Depth
      3. 6.1.3 Device List
      4. 6.1.4 Hardware Platforms and Software Examples
      5. 6.1.5 Documentation
    2. 6.2 Hardware Built-In Self-Test of the C28x CPU
      1. 6.2.1 Value Proposition
      2. 6.2.2 In Depth
      3. 6.2.3 Device List
      4. 6.2.4 Hardware Platforms and Software Examples
      5. 6.2.5 Documentation
    3. 6.3 Zero CPU Overhead Cyclic Redundancy Check for Embedded On-Chip Memories
      1. 6.3.1 Value Proposition
      2. 6.3.2 In Depth
      3. 6.3.3 Device List
      4. 6.3.4 Hardware Platforms and Software Examples
      5. 6.3.5 Documentation
    4. 6.4 Boot Code Authentication Prior To Code Execution
      1. 6.4.1 Value Proposition
      2. 6.4.2 In Depth
      3. 6.4.3 Device List
      4. 6.4.4 Hardware Platforms and Software Examples
        1. 6.4.4.1 Documentation
  9. 7References
    1. 7.1 Device List
    2. 7.2 Hardware/Software Resources
    3. 7.3 Documentation
  10. 8Revision History

6.2.2 In Depth

The Hardware Built-In Self-Test (HWBIST) provides a very high diagnostic coverage on the CPU, including the FPU, TMU, and VCU, at a transistor level during start-up and application time. This logic utilizes Design for Test (DfT) structures inserted into the device for rapid execution of high quality manufacturing tests, but with an internal test engine rather than external automated test equipment (ATE). This technique has proven to be effective in providing high coverage in less time.

HWBIST tests are triggered by the software. The user may select to run all tests or only a subset of the tests based on the execution time allocated for the diagnostic. This time sliced test feature enables the HWBIST to be used effectively as a runtime diagnostic with execution of test in parallel with the application. HWBIST execution failure such as detection of a logic failure or time out without the self-test completing triggers an NMI. The maximum level of diagnostic coverage provided by HWBIST depends on the device as shown in HWBIST Supported Diagnostic Coverage by Device.

Table 6-1 HWBIST Supported Diagnostic Coverage by Device
F2838xD/S F2837xD/S F2807x F28002x
> 99% DC > 99% DC > 99% DC > 99% DC

To configure and run HWBIST it is required to use the HWBIST APIs provided by the C2000 Software Diagnostic library. The functions provided enable running a single micro-run or running the full HWBIST test as well as configuring a self-test mode within HWBIST to allow a few different types of faults to be injected to check that it’s functioning correctly.