SPRUIE9D May 2017 – May 2024 DRA74P , DRA75P , DRA76P , DRA77P
The target debug interface has the following signals:
Table 35-1 describes the IEEE1149.1 signals.
Device Pad Name | Internal Signal Name | Type(1) | Function | Description |
---|---|---|---|---|
trstn | nTRST | I | Test reset | When asserted (active low), resets all test and debug logic in the device along with the IEEE1149.1 interface. |
tclk | TCK | I | Test clock | This is the test clock used to drive an IEEE1149.1 TAP state-machine and logic. This is either a free-running clock or a gated clock, depending on the DTC attached to the device and the RTCK monitoring. |
rtck | RTCK | O | Returned (synchronized) test clock | Depending on the DTC attached to the device, the JTAG signals are either clocked from RTCK or the RTCK is monitored by the DTC to the gate TCK. |
tms | TMS | I/O | Test mode select input | Directs the next state of the IEEE1149.1 TAP state-machine. |
tdi | TDI | I | Test data input | Scans data input to the device. |
tdo | TDO | O | Test data output | Scans data output by the device. |
emu0 | EMU0 | I/O | Emulation 0 | Channel 0 trigger or boot mode or trace port. |
emu1 | EMU1 | I/O | Emulation 1 | Channel 1 trigger or boot mode or trace port. |
For more information about device pads pull type resistors, see the device Data Manual, Section Signal Descriptions in Chapter Terminal Configuration and Functions.
The device JTAG ID code can be accessed through ICEPick. For information about the JTAG ID code value, see Chapter 1, Introduction.