8 Revision History
Changes from Revision * (March 2019) to Revision A (September 2020)
- Updated to reflect part change from TMP116 to
TMP117.Go
- Updated table to reflect part change from TMP116 to TMP117.Go
- Added Device Recommendation section to reflect part change from TMP116 to TMP117.Go
- Added Temperature Sensor - TMP117 section and Functional Block Diagramto reflect part change from TMP116 to TMP117Go
- Updated TMP117 Configuration as Temperature Sensor section and TMP117-Based Digital Temperature Sensor Circuit Configuration imageGo
- Updated DRTD Test Requirements section to update EMI requirements with new TMP117 part Go
- Added TMP117 EMI/EMC Test Results section including supporting tables to update EMI requirements with new TMP117 partGo
- Added EN 61000-4-3 Test Setup Diagram and EN 61000-4-3 Setup Inside the Chamber images detailing EMI testing for the TMP117 partGo
- Added the TMP117 Probe Measurement Performance Test
Results section including supporting imagesGo
- Removed PCB Layout Recommendation section Go
- Add two new authors to the About the Author section.Go