SBAK019 May   2024 ADC3683-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects
  6. Device and Test Board Information
  7. Irradiation Facility and Setup
  8. Depth, Range, and LETEFF Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
  11. Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. Event Rate Calculations
  13. 10Summary
  14. 11References

Single Event Transients

SETs are defined as heavy-ion-induced transients upsets on the DCLK of the ADC3683-SP. SET testing was performed at room temperature with no external temperature control applied. DCLK SEUs were characterized using a positive edge trigger. The devices were characterized with input voltages AVDD/IOVDD = 1.85V. To capture the event, the NI-PXI-5172 Scope Card was continuously monitoring the DCLK. The DCLK was monitored by using USER_LED3 that is located on the TSW1400EVM. The scope was attached to the LED which would go high upon because the FPGA was not receiving a valid clock signal. The scope triggering from DCLK was programmed to record 20K samples with a sample rate of 5M samples per second (S/s) in case of an event (trigger).

The scope was programmed to record 20% of the data before (pre-) the trigger happened. Events were seen on DCLK. The results were analyzed and categorized into short and long events based on DCLK recovery time. A short event is defined by a transient, which lasted less than 500ns while a long event lasts more than 500ns. An example of the events are shown Figure 8-2 and Figure 8-1. Table 8-1 lists the SET test condition and results for all the data.

Table 8-1 Summary of ADC3683-SP SET Test Conditions and Results
Run Number Run Type Unit Number Temp Ion Angle LETEFF (MeV.cm2/mg) Flux (ions·cm2/s) Fluence (ions·cm2) Count DCLK Events Count of Short Events Count of Long Events
1 SEU 1 Room 141Pr 30 78.67 1.00 × 104 1.00 × 106 14 8 6
2 SEU 1 Room 141Pr 30 78.67 1.00 × 102 1.00 × 105 1 0 1
3 SEU 1 Room 141Pr 0 67.45 1.00 × 104 1.00 × 106 8 5 3
4 SEU 1 Room 141Pr 0 67.45 1.00 × 102 1.00 × 105 1 1 0
5 SEU 1 Room 109Ag 30 59.82 1.00 × 105 1.00 × 107 114 82 32
6 SEU 1 Room 109Ag 30 59.82 1.00 × 104 1.00 × 106 7 6 1
7 SEU 1 Room 109Ag 30 59.82 1.00 × 102 1.00 × 105 1 0 1
8 SEU 1 Room 109Ag 0 51.12 1.00 × 102 1.00 × 105 1 1 0
9 SEU 1 Room 109Ag 0 51.12 1.00 × 104 1.00 × 106 6 4 2
10 SEU 1 Room 63Cu 0 21.44 1.00 × 102 1.00 × 105 3 1 2
11 SEU 1 Room 63Cu 0 21.44 1.00 × 104 1.00 × 106 5 5 0
12 SEU 1 Room 63Cu 0 21.44 1.00 × 105 1.00 × 107 50 43 7
ADC3683-SP Example of a Short Event from
                    Run 12 Figure 8-1 Example of a Short Event from Run 12
ADC3683-SP Example of a Long Event from
                    Run 12 Figure 8-2 Example of a Long Event from Run 12