SBAK021 December   2024 AFE7950-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
  10. 7Single-Event Effects (SEE)
  11. 8Event Rate Calculations
  12. 9References

Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the AFE7950-SP. Heavy-ions with LETEFF (Effective Linear Energy Transfer) of up to 70 MeV·cm2/mg were used to irradiate the device. Tests were run across a range of flux and fluences for the characterization. Flux was between 102 and 105 ions/(cm2·s) and fluence up to 107 ions/cm2 per run. The results demonstrated that the AFE7950-SP is single event latch-up free at a device junction temperature of 125°C. Single event upsets and functional interrupts are characterized at ambient room temperature, no external heat applied, up to 58 MeV·cm2/mg. See Section 7 for more details.