SBAS649B June 2021 – June 2022 DAC12DL3200
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
LATENCY | ||||||
TDAC | DAC sampling period | 1 / fCLK | s | |||
tLAT | digital input to DAC output sample latency | single clock mode, 4 LVDS banks for 1 DAC | 35.5 | TDAC | ||
single clock mode, 2 LVDS banks per DAC | 20.5 | |||||
single clock mode, 1 LVDS bank per DAC | 12.5 | |||||
dual clock mode, 2 LVDS banks per DAC | 35.5 | |||||
dual clock mode, 1 LVDS bank per DAC | 20.5 | |||||
tPDI | Input clock rising edge cross-over to output sample cross-over | 680 | ps | |||
SERIAL PROGRAMMING INTERFACE | ||||||
Fs_c_r | serial clock frequency reading | 100 | MHz | |||
Fs_c_w | serial clock frequency writing | 200 | MHz | |||
Fs_cts | serial clock frequency temp sensor | 1 | MHz | |||
tP_W | serial clock period for writing | 5 | ns | |||
tP_R | serial clock period for reading | 10 | ns | |||
tPH | serial clock pulse width high | 2 | ns | |||
tPL | serial clock pulse width low | 2 | ns | |||
tSU | SDI setup | 1 | ns | |||
tH | SDI hold | 1 | ns | |||
tIZ | SDI TRI-STATE | 1 | ns | |||
tODZ | SDO driven to TRI-STATE | 200 fF load | 0 | 1.5 | ns | |
tOZD | SDO TRI-STATE to driven | 200 fF load | 0 | 1.5 | ns | |
tOD | SDO output delay | 200 fF load | 0 | 6 | ns | |
tCSS | SCS setup | 1 | ns | |||
tCSH | SCS hold | 1 | ns | |||
tIAG | Inter-access gap | 1 | ns |