SBOA446 March 2021 TLV9002-Q1 , TLV9004-Q1
Figure 4-2 shows the TLV9004-Q1 pin diagram for the SOT-23 (14) and SOIC (14) packages. For a detailed description of the device pins please refer to the 'Pin Configuration and Functions' section in the TLV9004-Q1 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
OUT1 | 1 | May cause overheating. | B |
IN1- | 2 | Input at V- is valid input, however, desired application result is unlikely. | C |
IN1+ | 3 | Input at V- is valid input, however, desired application result is unlikely. | C |
(V+) | 4 | Diodes from input to V+ may turn due to input signal and cause EOS. | B |
IN2+ | 5 | Input at V- is valid input, however, desired application result is unlikely. | C |
IN2- | 6 | Input at V- is valid input, however, desired application result is unlikely. | C |
OUT2 | 7 | May cause overheating. | B |
OUT3 | 8 | May cause overheating. | B |
IN3- | 9 | Input at V- is valid input, however, desired application result is unlikely. | C |
IN3+ | 10 | Input at V- is valid input, however, desired application result is unlikely. | C |
(V-) | 11 | Normal operation. | D |
IN4+ | 12 | Input at V- is valid input, however, desired application result is unlikely. | C |
IN4- | 13 | Input at V- is valid input, however, desired application result is unlikely. | C |
OUT4 | 14 | May cause overheating. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
OUT1 | 1 | Output can't be used by application. | C |
IN1- | 2 | Floating input, circuit will likely not function as expected. | C |
IN1+ | 3 | Floating input, circuit will likely not function as expected. | C |
(V+) | 4 | Highest voltage pin will try to power internal ground via ESD diode to VCC. | B |
IN2+ | 5 | Floating input, circuit will likely not function as expected. | C |
IN2- | 6 | Floating input, circuit will likely not function as expected. | C |
OUT2 | 7 | Output can't be used by application. | C |
OUT3 | 8 | Output can't be used by application. | C |
IN3- | 9 | Floating input, circuit will likely not function as expected. | C |
IN3+ | 10 | Floating input, circuit will likely not function as expected. | C |
(V-) | 11 | Lowest voltage pin will try to power internal ground via ESD diode to ground. | B |
IN4+ | 12 | Floating input, circuit will likely not function as expected. | C |
IN4- | 13 | Floating input, circuit will likely not function as expected. | C |
OUT4 | 14 | Output can't be used by application. | C |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
OUT1 | 1 | May cause overheating. | B |
IN1- | 2 | Input at V+ is valid input, however, desired application result is unlikely. | C |
IN1+ | 3 | Input at V+ is valid input, however, desired application result is unlikely. | C |
(V+) | 4 | Normal operation. | D |
IN2+ | 5 | Input at V+ is valid input, however, desired application result is unlikely. | C |
IN2- | 6 | Input at V+ is valid input, however, desired application result is unlikely. | C |
OUT2 | 7 | May cause overheating. | B |
OUT3 | 8 | May cause overheating. | B |
IN3- | 9 | Input at V+ is valid input, however, desired application result is unlikely. | C |
IN3+ | 10 | Input at V+ is valid input, however, desired application result is unlikely. | C |
(V-) | 11 | Diodes from input to V- may turn due to input signal and cause EOS. | B |
IN4+ | 12 | Input at V+ is valid input, however, desired application result is unlikely. | C |
IN4- | 13 | Input at V+ is valid input, however, desired application result is unlikely. | C |
OUT4 | 14 | May cause overheating. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
OUT1 | 1 | IN1- | Negative feedback, creates unity gain buffer. | C |
IN1- | 2 | IN1+ | No damage to device, application circuit won't work. | C |
IN1+ | 3 | (V+) | Input at V+ is valid input, however, desired application result is unlikely. | C |
(V+) | 4 | IN2+ | Input at V+ is valid input, however, desired application result is unlikely. | C |
IN2+ | 5 | IN2- | No damage to device, application circuit won't work. | C |
IN2- | 6 | OUT2 | Negative feedback, creates unity gain buffer. | C |
OUT2 | 7 | OUT3 | May cause overheating (pins on opposite sides, not adjacent). | B |
OUT3 | 8 | IN3- | Negative feedback, creates unity gain buffer. | C |
IN3- | 9 | IN3+ | No damage to device, application circuit won't work. | C |
IN3+ | 10 | (V-) | Input at ground is valid input, however, desired application result is unlikely. | C |
(V-) | 11 | IN4+ | CH 4 output high, if other input is valid common mode range. | C |
IN4+ | 12 | IN4- | No damage to device, application circuit won't work. | C |
IN4- | 13 | OUT4 | Negative feedback, creates unity gain buffer. | C |
OUT4 | 14 | OUT1 | May cause overheating (pins on opposite sides, not adjacent). | B |