This report presents the effect of neutron displacement damage (NDD) on the TRF0206-SP device. The results show that all devices were fully functional and within production test limits after having been irradiated up to 1 × 1013 n/cm2 (1-MeV equivalent). A sample size of fifteen units was exposed to radiation testing per (MIL-STD-883, Method 1017 for Neutron Irradiation) and an additional unirradiated sample device was used for correlation. All devices used in the experiment were from lot date code 2227B and assembly lot 2007400. Electrical testing was performed at Texas Instruments before and after neutron irradiation using the production test program for 5962R2122001VXC.
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The TRF0206-SP is a very high-performance, radiation hardened, differential amplifier optimized for radio frequency (RF), intermediate frequency (IF), or high-speed applications. The device is ideal for ac-coupled applications that may require a single-ended-to-differential (S2D) conversion when driving an analog-to-digital converter (ADC). The TRF0206-SP generates very low levels of second- and third-order distortion upto very high frequencies. General device information and testing conditions are listed in Table 1-1.
TI Part Number | TRF0206-SP |
---|---|
SMD Number | 5962-21220 |
Device Function | 6.5 GHz Bandwidth, High-linearity ADC Driver Amplifier |
Die Name | RTRF0206A0 |
Technology | RF SiGe |
A/T Lot Number / Date Code | 2007400 / 2227B |
Unbiased Quantity Tested | 9 |
Exposure Facility | VPT Rad |
Neutron Fluence (1-MeV Equivalent) | 1.0 × 1012, 5.0 × 1012, 1.0 × 1013 n/cm2 |
Irradiation Temperature | 25°C |
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The TRF0206-SP was electrically pre-tested using the production automated test equipment program. General test procedures were IAW MIL-STD-883, Method 1017 for Neutron Irradiation of TRF0206-SP as modified in Table 2-1.
Group | Sample Qty | Neutron Fluence (n/cm2) | Bias |
---|---|---|---|
A |
3 |
1.0 × 1012 | Unbiased |
B |
3 |
5.0 × 1012 | Unbiased |
C |
3 |
1.0 × 1013 | Unbiased |