SBOK073 august   2023 TRF0206-SP

PRODUCTION DATA  

  1.   1
  2.   2
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  6. 3Total Ionizing Dose Characterization Test Results
    1. 3.1 Total Ionizing Dose RHA Characterization Summary Results
  7. 4Applicable and Reference Documents
    1. 4.1 Reference Documents
  8. 5Test List
  9.   A HDR Total Ionizing Dose Report
  10.   B LDR Total Ionizing Dose Report

Test Description and Facilities

The TRF0206-SP LDR exposure was performed on biased and unbiased devices in a60Co gamma cell under a 10-mrad(Si)/s exposure rate. The dose rate of the irradiator used in the exposure ranges from < 10 mrad(Si)/s to a maximum of approximately 65 rad(Si)/s, determined by the distance from the source. For the LDR (10 mrad(Si)/s) exposure, the test box was positioned approximately 2 m from the source. The exposure boards are housed in a lead-aluminum box (as specified in MIL-STD-883 TM 1019.9) to harden the gamma spectrum and minimize dose enhancement effects. The irradiator calibration is maintained by Longmire Laboratories using thermoluminescence dosimeters (TLDs) traceable to the National Institute of Standards and Technology (NIST) and the dosimetry was verified using TLDs prior to the radiation exposures. After exposure, the devices were packed in dry ice (per MIL-STD-883 Method 1019.9 section 3.10) and returned to TI Dallas for a full post-radiation electrical evaluation using Texas Instruments production ATE. The ATE test limits are set within SMD electrical limits and are guardbanded to ensure a minimum Cpk and test error margin based on initial qualification and characterization data. Post radiation measurements were taken within 30 minutes of removal of the devices from the dry ice container. The devices were allowed to reach room temperature prior to electrical post-radiation measurements.

The TRF0206-SP HDR exposure was performed on biased and unbiased devices in a Co-60 gamma cell at Cobham RAD Solutions in Colorado Springs, CO. The unattenuated dose rate of this cell was263 rad(Si)/s. After exposure, the devices were packed in dry ice (per MIL-STD-883 Method 1019.9 section 3.10) and returned to TI Dallas for a full post irradiation electrical evaluation using Texas Instruments' ATE. The ATE test limits are set within SMD electrical limits and are guardbanded to ensure a minimum Cpk and test error margin based on initial qualification and characterization data. Post irradiation measurements were taken within 30 minutes of removal of the devices from the dry ice container. The devices were allowed to reach room temperature prior to electrical post irradiation measurements.