SFFS495 September 2022 UCC28C50-Q1 , UCC28C51-Q1 , UCC28C52-Q1 , UCC28C53-Q1 , UCC28C54-Q1 , UCC28C55-Q1 , UCC28C56L-Q1 , UCC28C57H-Q1 , UCC28C57L-Q1 , UCC28C58-Q1 , UCC28C59-Q1
This document contains information for UCC28C50-Q1, UCC28C51-Q1, UCC28C52-Q1, UCC28C53-Q1, UCC28C54-Q1, UCC28C55-Q1, UCC28C56H-Q1, UCC28C56L-Q1, UCC28C57H-Q1, UCC28C57L-Q1, UCC28C58-Q1, and UCC28C59-Q1, SOIC (8) package, to aid in a functional safety system design. Information provided are:
Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of
industry reliability standards
Figure 1-1shows the device functional block diagram for reference.
Toggle flip-flop used only in UCC28C51-Q1, UCC28C54-Q1, and UCC28C55-Q1, UCC28C57H-Q1, UCC28C57L-Q1, and UCC28C59-Q1
UCC28C5x-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.
UVLO | MAXIMUM DUTY CYCLE | TEMPERATURE (TA) | ||
---|---|---|---|---|
TURN ON AT 14.5 V TURN OFF AT 9 V SUITABLE FOR OFF-LINE APPLICATIONS |
TURN ON AT 8.4 V TURN OFF AT 7.6 V SUITABLE FOR DC/DC APPLICATIONS |
TURN ON AT 7 V TURN OFF AT 6.6 V SUITABLE FOR BATTERY APPLICATIONS |
||
UCC28C52QDRQ1 | UCC28C53QDRQ1 | UCC28C50QDRQ1 | 100% | –40°C to 125°C |
UCC28C54QDRQ1 | UCC28C55QDRQ1 | UCC28C51QDRQ1 | 50% |
UVLO | MAXIMUM DUTY CYCLE | TEMPERATURE (TA) | ||
---|---|---|---|---|
TURN ON AT 18.8 V TURN OFF AT 15.5V Suitable for HV applications using GEN-I SiC MOSFET |
TURN ON AT 18.8 V TURN OFF AT 14.5V |
TURN ON AT 16 V TURN OFF AT 12.5V |
||
UCC28C56HQDRQ1 | UCC28C56LQDRQ1 | UCC28C58QDRQ1 | 100% | –40°C to 125°C |
UCC28C57HQDRQ1 | UCC28C57LQDRQ1 | UCC28C59QDRQ1 | 50% |
This section provides Functional Safety Failure In Time (FIT) rates for SOIC (8) package of UCC28C5x-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate (71.6 mW, 150 mW, 300 mW) | 10, 11, 15 |
Die FIT Rate (71.6 mW, 150 mW, 300 mW) | 3, 4, 7 |
Package FIT Rate (71.6 mW, 150 mW, 300 mW) | 7, 7, 8 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.