SFFS495 September   2022 UCC28C50-Q1 , UCC28C51-Q1 , UCC28C52-Q1 , UCC28C53-Q1 , UCC28C54-Q1 , UCC28C55-Q1 , UCC28C56L-Q1 , UCC28C57H-Q1 , UCC28C57L-Q1 , UCC28C58-Q1 , UCC28C59-Q1

 

  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 SOIC (8) Package
  3. 3Failure Mode Distribution (FMD)
  4. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 SOIC (8) Package
  5. 5Revision History

Failure Mode Distribution (FMD)

The failure mode distribution estimation for UCC28C5x-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
OUT stuck low34
OUT pulse width not as expected19
OUT stuck high14
System is unstable11
No effect22