SFFS618 September 2024 TPS1213-Q1
The failure mode distribution estimation for TPS1213-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Gate output stuck high | 10 |
Gate output stuck low | 45 |
Gate output functional, not in specification voltage or timing | 34 |
Short circuit protection fails to trip or false trip | 5 |
UVLO fails to trip or false trip | 1 |
Pin-to-pin short any two pins | 5 |