SFFS657 august 2023 AMC1035-Q1
The failure mode distribution estimation for the AMC1035-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
DOUT stuck high or low | 30% |
Bitstream output out of specification (equivalent to gain error) | 20% |
Device behavior undetermined | 20% |
Bitstream output out of specification (equivalent to offset error) | 15% |
Reference output out of specification(1) | 10% |
Bitstream output out of specification (increased noise) | 5% |