SFFS834 March 2024 DAC53204-Q1 , DAC63204-Q1
The failure mode distribution estimation for the DACx3204-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or over stress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Digital core and interface failure | 29 |
| NVM retention loss | 10 |
| POR failure | 5 |
| Reference failure | 5 |
| DAC output failure | 51 |