SFFS868A April 2024 – December 2024 ISOM8110-Q1 , ISOM8111-Q1 , ISOM8112-Q1 , ISOM8113-Q1 , ISOM8115-Q1 , ISOM8116-Q1 , ISOM8117-Q1 , ISOM8118-Q1

4 Pin Failure Mode Analysis (Pin FMA)

This section provides a failure mode analysis (FMA) for the pins of the ISOM811(0-3)-Q1 and ISOM811(5-8)-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Pin short-circuited to ground (see Table 4-6 and Table 4-6)
Pin open-circuited (see Table 4-7 and Table 4-7)
Pin short-circuited to an adjacent pin (see Table 4-8 and Table 4-8)
Pin short-circuited to supply (see Table 4-9 and Table 4-9)

Table 4-6 through Table 4-9 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects

Class	Failure Effects
A	Potential device damage that affects functionality.
B	No device damage, but loss of functionality.
C	No device damage, but performance degradation.
D	No device damage, no impact to functionality or performance.

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

Device is operated in accordance to the Recommended Operating Conditions table in the data sheet.
For the ISOM811(5-8)-Q1 devices, input forward current is only applied to one of the AN/CAT pins, while the other pin provides the return path to complete the circuit when not being shorted.