SFFS979 August 2024 TSD5402-Q1
4 Pin Failure Mode Analysis (Pin FMA)
This section provides a failure mode analysis (FMA) for the pins of the TSD5402-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
- Pin short-circuited to ground (see Table 4-2)
- Pin open-circuited (see Table 4-3)
- Pin short-circuited to an adjacent pin (see Table 4-4)
- Pin short-circuited to supply (PVDD) (see Table 4-5)
Table 4-2 through Table 4-5 indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Table 4-1 TI Classification of Failure Effects
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality. |
| B | No device damage, but loss of functionality. |
| C | No device damage, but performance degradation. |
| D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the TSD5402-Q1 pin diagram. For a detailed description of the device pins, refer to the Pin Configuration and Functions section in the TSD5402-Q1 data sheet.
Figure 4-1 TSD5402-Q1 Pin DiagramFollowing are the assumptions of use and the device configuration assumed for the pin FMA in this section:
- TC = 25 °C
- PVDD = 4.5V - 18V
- RL = 4Ω
- POUT = 1W
- AES17 Filter, Default I2C settings
- Output channel in DRIVE mode
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| GND | 1 | No effects. | D |
| /STANDBY | 2 | Device is in standby mode. | B |
| BYP | 3 | LDO trigger current limit protection, if under continuous stress, can heat up. | B |
| SDA | 4 | I2C interface does not work. | B |
| SCL | 5 | I2C interface does not work. | B |
| IN_P | 6 | Device not able to deliver power. | B |
| IN_N | 7 | Device not able to deliver power. | B |
| HI-Z | 8 | No effects. | D |
| GND | 9 | No effects. | D |
| BSTN | 10 | Output cannot be driven to logic-1 (PVDD). Can trigger overcurrent protection. | B |
| OUTN | 11 | Output overcurrent protection. Device shutdown. Fault latches. | B |
| OUTP | 12 | Output overcurrent protection. Device shutdown. Fault latches. | B |
| BSTP | 13 | Output cannot be driven to logic-1 (PVDD). Can trigger overcurrent protection. | B |
| /FAULT | 14 | FAULT cannot assert correctly, can affect the system MCU. | B |
| PVDD | 15 | No damage to device considering power and ground are at same potential. | B |
| GND | 16 | No effects. | D |
Table 4-3 Pin FMA for Device Pins Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| GND | 1 | If all GNDs are disconnected, device damage is possible. If only one GND is disconnected, the device is functional but performance can degrade. | A |
| /STANDBY | 2 | Internal pull-down resistor is standby the device. | B |
| BYP | 3 | Driver potentially does not work correctly and can trigger overcurrent protection. | B |
| SDA | 4 | Device does not respond to I2C command. | B |
| SCL | 5 | Device does not respond to I2C command. | B |
| IN_P | 6 | Device is not able to deliver power. | B |
| IN_N | 7 | Device is not able to deliver power. | B |
| HI-Z | 8 | Device can be in Hi-z state. | B |
| GND | 9 | If all GNDs are disconnected, device damage is possible. If only one GND is not connected, device is functional but performance can degrade. | A |
| BSTN | 10 | Output cannot be driven to logic-1 (PVDD). | B |
| OUTN | 11 | Open-load condition. | C |
| OUTP | 12 | Open-load condition. | C |
| BSTP | 13 | Output cannot be driven to logic-1 (PVDD). | B |
| /FAULT | 14 | FAULTZ cannot be reported to the system. | B |
| PVDD | 15 | Device does not start up. | B |
| GND | 16 | If all GNDs are disconnected, device damage is possible. If only one GND is disconnected, device is functional but performance can degrade. | A |
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| GND | 1 | 2 | Device is in standby mode. | B |
| /STANDBY | 2 | 3 | Device is in standby mode. | B |
| BYP | 3 | 4 | LDO trigger current limit protection, if under continuous stress, can heat up. | B |
| SDA | 4 | 5 | Device does not respond to I2C command. | B |
| SCL | 5 | 6 | Device does not respond to I2C command. | B |
| IN_P | 6 | 7 | Amplifier gain is not correct. | |
| IN_N | 7 | 8 | Amplifier gain is not correct. | B |
| HI-Z | 8 | 9 | Device can be in Hi-z state. | B |
| GND | 9 | 10 | Signal performance degradation. | C |
| BSTN | 10 | 11 | Output cannot be driven to logic-1 (PVDD). Can trigger overcurrent protection. | B |
| OUTN | 11 | 12 | Report overcurrent fault. | B |
| OUTP | 12 | 13 | Report overcurrent fault. | B |
| BSTP | 13 | 14 | Output cannot be driven to logic-1 (PVDD). Can trigger overcurrent protection. | B |
| /FAULT | 14 | 15 | FAULT cannot assert correctly, can affect system MCU. | B |
| PVDD | 15 | 16 | Device does not start up. | B |
| GND | 16 | 15 | Device does not start up. | B |
Table 4-5 Pin FMA for Device Pins Short-Circuited to PVDD
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| GND | 1 | System-level fault. Power short to ground. | B |
| /STANDBY | 2 | Device damage is possible. | A |
| BYP | 3 | Device damage is possible. | A |
| SDA | 4 | Device damage is possible. | A |
| SCL | 5 | Device damage is possible. | A |
| IN_P | 6 | Device damage is possible. | A |
| IN_N | 7 | Device damage is possible. | A |
| HI-Z | 8 | Device damage is possible. | A |
| GND | 9 | System-level fault. Power short to ground. | B |
| BSTN | 10 | Device damage is possible. | A |
| OUTN | 11 | Output S2P event, protected if short after filter. | B |
| OUTP | 12 | Output S2P event, protected if short after filter. | B |
| BSTP | 13 | Device damage is possible. | A |
| /FAULT | 14 | FAULT cannot assert correctly and can affect system MCU. | B |
| PVDD | 15 | No effect. | D |
| GND | 16 | System-level fault. Power short to ground. | B |