SLAA392A March 2008 – August 2018 MSP430BT5190 , MSP430F1101 , MSP430F1101A , MSP430F1111A , MSP430F112 , MSP430F1121 , MSP430F1121A , MSP430F1122 , MSP430F1132 , MSP430F122 , MSP430F1222 , MSP430F123 , MSP430F1232 , MSP430F133 , MSP430F135 , MSP430F147 , MSP430F1471 , MSP430F148 , MSP430F1481 , MSP430F149 , MSP430F1491 , MSP430F155 , MSP430F156 , MSP430F157 , MSP430F1610 , MSP430F1611 , MSP430F1612 , MSP430F167 , MSP430F168 , MSP430F169 , MSP430F2001 , MSP430F2002 , MSP430F2003 , MSP430F2011 , MSP430F2012 , MSP430F2013 , MSP430F2013-EP , MSP430F2101 , MSP430F2111 , MSP430F2112 , MSP430F2121 , MSP430F2122 , MSP430F2131 , MSP430F2132 , MSP430F2232 , MSP430F2234 , MSP430F2252 , MSP430F2252-Q1 , MSP430F2254 , MSP430F2272 , MSP430F2272-Q1 , MSP430F2274 , MSP430F233 , MSP430F2330 , MSP430F235 , MSP430F2350 , MSP430F2370 , MSP430F2410 , MSP430F2416 , MSP430F2417 , MSP430F2418 , MSP430F2419 , MSP430F247 , MSP430F2471 , MSP430F248 , MSP430F2481 , MSP430F249 , MSP430F2491 , MSP430F2616 , MSP430F2617 , MSP430F2618 , MSP430F2619 , MSP430F412 , MSP430F413 , MSP430F4132 , MSP430F415 , MSP430F4152 , MSP430F417 , MSP430F423 , MSP430F423A , MSP430F425 , MSP430F4250 , MSP430F425A , MSP430F4260 , MSP430F427 , MSP430F4270 , MSP430F427A , MSP430F435 , MSP430F4351 , MSP430F436 , MSP430F4361 , MSP430F437 , MSP430F4371 , MSP430F438 , MSP430F439 , MSP430F447 , MSP430F448 , MSP430F4481 , MSP430F449 , MSP430F4491 , MSP430F4616 , MSP430F46161 , MSP430F4617 , MSP430F46171 , MSP430F4618 , MSP430F46181 , MSP430F4619 , MSP430F46191 , MSP430F47126 , MSP430F47127 , MSP430F47163 , MSP430F47166 , MSP430F47167 , MSP430F47173 , MSP430F47176 , MSP430F47177 , MSP430F47183 , MSP430F47186 , MSP430F47187 , MSP430F47193 , MSP430F47196 , MSP430F47197 , MSP430F477 , MSP430F478 , MSP430F4783 , MSP430F4784 , MSP430F479 , MSP430F4793 , MSP430F4794 , MSP430F5131 , MSP430F5132 , MSP430F5151 , MSP430F5152 , MSP430F5171 , MSP430F5172 , MSP430F5304 , MSP430F5308 , MSP430F5309 , MSP430F5310 , MSP430F5324 , MSP430F5325 , MSP430F5326 , MSP430F5327 , MSP430F5328 , MSP430F5329 , MSP430F5333 , MSP430F5336 , MSP430F5338 , MSP430F5340 , MSP430F5341 , MSP430F5342 , MSP430F5418 , MSP430F5418A , MSP430F5419 , MSP430F5419A , MSP430F5435 , MSP430F5435A , MSP430F5436 , MSP430F5436A , MSP430F5437 , MSP430F5437A , MSP430F5438 , MSP430F5438A , MSP430F5500 , MSP430F5501 , MSP430F5502 , MSP430F5503 , MSP430F5504 , MSP430F5505 , MSP430F5506 , MSP430F5507 , MSP430F5508 , MSP430F5509 , MSP430F5510 , MSP430F5513 , MSP430F5514 , MSP430F5515 , MSP430F5517 , MSP430F5519 , MSP430F5521 , MSP430F5522 , MSP430F5524 , MSP430F5525 , MSP430F5526 , MSP430F5527 , MSP430F5528 , MSP430F5529 , MSP430F5630 , MSP430F5631 , MSP430F5632 , MSP430F5633 , MSP430F5634 , MSP430F5635 , MSP430F5636 , MSP430F5637 , MSP430F5638 , MSP430F6433 , MSP430F6435 , MSP430F6436 , MSP430F6438 , MSP430F6630 , MSP430F6631 , MSP430F6632 , MSP430F6633 , MSP430F6634 , MSP430F6635 , MSP430F6636 , MSP430F6637 , MSP430F6638 , MSP430FE423 , MSP430FE4232 , MSP430FE423A , MSP430FE4242 , MSP430FE425 , MSP430FE4252 , MSP430FE425A , MSP430FE427 , MSP430FE4272 , MSP430FE427A , MSP430FG4250 , MSP430FG4260 , MSP430FG4270 , MSP430FG437 , MSP430FG438 , MSP430FG439 , MSP430FG4616 , MSP430FG4617 , MSP430FG4618 , MSP430FG4619 , MSP430FG477 , MSP430FG478 , MSP430FG479 , MSP430FW423 , MSP430FW425 , MSP430FW427 , MSP430G2001 , MSP430G2101 , MSP430G2102 , MSP430G2111 , MSP430G2112 , MSP430G2121 , MSP430G2131 , MSP430G2132 , MSP430G2152 , MSP430G2201 , MSP430G2201-Q1 , MSP430G2211 , MSP430G2212 , MSP430G2221 , MSP430G2231 , MSP430G2231-Q1 , MSP430G2232 , MSP430G2252 , MSP430G2302 , MSP430G2312 , MSP430G2332 , MSP430G2352 , MSP430G2402 , MSP430G2432 , MSP430G2452 , MSP430L092
To test the flash data retention at various temperatures we make use of accelerated tests on the flash. These tests are wholly based on Arrhenius law and equation. The Arrhenius theory allows the test of any device under accelerated environments for short periods and predicts the behavior under normal conditions for longer periods. Similar tests are performed on the MSP430 flash to test and predict data retention. During each test, an unprogrammed device is subjected to these tests. A flash failure is indicated when any of the flash cells change from an unprogrammed state (logic 1) to logic 0.
Equation 1 shows the Arrhenius equation.
where
Depending on AF, a back calculation using the Arrhenius equation for any desired temperature leads to fairly accurate data-retention times.