SLAAED9 November   2023 TAA5412-Q1 , TAC5311-Q1 , TAC5312-Q1 , TAC5411-Q1 , TAC5412-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. Introduction
  5. Diagnostic Monitoring Architecture
  6. Monitored Faults
    1. 3.1 Microphone Faults
      1. 3.1.1 Inputs Shorted to Ground
      2. 3.1.2 Inputs Shorted to MICBIAS
      3. 3.1.3 Input Open Circuit
      4. 3.1.4 Input Pins Shorted Together
      5. 3.1.5 Input Overvoltage Detection
      6. 3.1.6 Inputs Shorted to VBAT
    2. 3.2 Line Out Faults
      1. 3.2.1 Output Overcurrent
      2. 3.2.2 Virtual Ground
    3. 3.3 Other Faults
      1. 3.3.1 MICBIAS Overvoltage
        1. 3.3.1.1 DIAG_CFG11 Register (page = 0x01, address = 0x51) [Reset = 0x40]
      2. 3.3.2 MICBIAS Overcurrent
      3. 3.3.3 MICBIAS Load Current
        1. 3.3.3.1 DIAG_CFG6 Register (page = 0x01, address = 0x4C) [Reset = 0xA2]
        2. 3.3.3.2 DIAG_CFG7 Register
      4. 3.3.4 Overtemperature Fault
      5. 3.3.5 Supply Back Pumping
  7. Enabling Diagnostics and Programming Thresholds
    1. 4.1 DIAG_CFG0 Register (page = 0x01, Address = 0x46) [Reset = 0x00]
    2. 4.2 DIAG_CFG1 Register (page = 0x01, Address = 0x47) [Reset = 0x37]
    3. 4.3 DIAG_CFG2 Register (page = 0x01, Address = 0x48) [Reset = 0x87]
  8. Fault Diagnostic Setup Procedure
  9. Fault Reporting
    1. 6.1 Live Registers
      1. 6.1.1 CHx_LIVE Register (page = 0x01, address = 0x3D) [Reset = 0b]
      2. 6.1.2 CH1_LIVE Register (page = 0x01, address = 0x3E) [Reset = 0h]
      3. 6.1.3 INT_LIVE0 Register (page = 0x01, address = 0x3C) [Reset = 00]
      4. 6.1.4 INT_LIVE1 Register (page = 0x00, address = 0x42) [reset = 0x00]
      5. 6.1.5 INT_LIVE2 Register (page = 0x00, address = 0x43) [reset = 0x00]
    2. 6.2 Latched Registers
      1. 6.2.1 Clearing Latched Registers
    3. 6.3 Fault Filtering and Response Time
      1. 6.3.1 Debounce
      2. 6.3.2 Scan Rate
        1. 6.3.2.1 DIAG_CFG4 Register (page = 0x01, address = 0x4A) [reset = 0xB8]
      3. 6.3.3 Moving Average
        1. 6.3.3.1 DIAG_CFG5 Register (page = 0x01, address = 0x4B) [reset = 0h]
  10. Responding to a Fault
    1. 7.1 INT_CFG Register (page = 0x00, address = 0x42) [reset = 0b]
      1. 7.1.1 DIAG_CFG10 Register (page = 0x01, address = 0x50) [Reset = 0x88]
    2. 7.2 Manual Recovery Sequence
    3. 7.3 Recommended Fault Register Read Sequence
  11. Using PurePath Console
    1. 8.1 Advanced Tab
    2. 8.2 Diagnostics Walk-through
      1. 8.2.1 Diagnostics Configuration
      2. 8.2.2 Debounce Configuration
      3. 8.2.3 Latched Fault Status
  12. Diagnostic Monitoring Registers
    1. 9.1 Voltage Measurements
    2. 9.2 MICBIAS Load Current
    3. 9.3 Internal Die Temperature
  13. 10Summary
  14. 11References

Scan Rate

When diagnostics are enabled, the fault diagnostic signal chain is constantly scanning the input channels. This multiplexing occurs automatically, but the rate at which the channels are scanned can be adjusted in DIAG_CFG4. The repetition rate can be set to 1 ms, 4 ms, 8 ms, or set to continuously scan as fast as possible. The default scan rate is 4 ms. The scan rate is the time between the end of one scan cycle and the beginning of the next. Since the sample rate of the diagnostic ADC is typically much faster than the scan rate, the scan rate is effectively the time between fault readings. Using the continuous back-to-back scan mode is recommended for the fastest response time and greatest signal integrity for the record channel. This selection causes the diagnostic ADC to sample at the same rate as the audio ADC and eliminates the small amount of coupling distortion that can arise from discontinuities in the diagnostic sampling. The power consumption of the diagnostic signal chain scales with the scan repetition rate. In back-to-back continuous scanning, the AVDD current can be expected to increase by approximately 2.5 mA compared to the 4-ms scan rate setting. For this reason, continuously scanning in power-sensitive applications is not recommended unless a system is particularly prone to faults and fast response time is needed.