SLAAEH8 October   2024 AFE781H1 , AFE782H1 , AFE881H1 , AFE882H1 , DAC8740H , DAC8741H , DAC8742H

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
    1. 1.1 The 4-20mA Loop
    2. 1.2 The HART Protocol
      1. 1.2.1 Adding HART to the 4-20mA Loop
      2. 1.2.2 HART FSK
  5. 2AFE881H1 HART Modem
    1. 2.1 AFE881H1 HART Transmitter
    2. 2.2 Detailed Schematic
      1. 2.2.1 Input Protection
      2. 2.2.2 Startup Circuit
      3. 2.2.3 Voltage-to-Current Stage
      4. 2.2.4 Voltage-to-Current Calculation
      5. 2.2.5 HART Signal Transmission
      6. 2.2.6 HART Input Protection
      7. 2.2.7 Current Consumption
      8. 2.2.8 HART Transmitter Board
      9. 2.2.9 HART Protocol Stack
  6. 3HART Testing and Registration
    1. 3.1  HART History and the FieldComm Group
    2. 3.2  HART Testing Overview
      1. 3.2.1 HART Protocol Specifications
      2. 3.2.2 HART Protocol Test Specifications
      3. 3.2.3 Remote Transmitter Device Testing
    3. 3.3  HART Test Equipment
    4. 3.4  HART Physical Layer Testing
      1. 3.4.1 FSK Sinusoid Test
      2. 3.4.2 Carrier Start and Stop Time Tests
      3. 3.4.3 Carrier Start and Stop Transient Tests
      4. 3.4.4 Output Noise During Silence
      5. 3.4.5 Analog Rate of Change Test
      6. 3.4.6 Receive Impedance Test
      7. 3.4.7 Noise Sensitivity Test
      8. 3.4.8 Carrier Detect Test
    5. 3.5  Data Link Layer Tests
      1. 3.5.1 Data Link Layer Test Specifications
      2. 3.5.2 Data Link Layer Test Logs
    6. 3.6  Universal Command Tests
    7. 3.7  Common-Practice Command Tests
    8. 3.8  Device Specific Command Tests
    9. 3.9  HART Protocol Test Submission
    10. 3.10 HART Registration
  7. 4Other TI HART Modem Designs
  8. 5Summary
  9. 6Acknowledgments
  10. 7References

3.8 Device Specific Command Tests

In addition to the universal commands and the common-practice commands, manufacturers can implement device specific commands into devices. The following list shows some device specific commands that can be implemented.

  • Read or write low-flow cut-off
  • Start, stop, or clear totalizer
  • Read or write density calibration factor
  • Choose PV (mass, flow, or density)
  • Read or write materials or construction information
  • Trim sensor calibration
  • PID enable
  • Write PID set point
  • Valve characterization
  • Valve set point
  • Travel limits
  • User units
  • Local display information

Again, these commands can be implemented by device manufacturers but are not required. Device specific commands are not tested through the HART specification and are not implemented as tests in the HART test system.