SLAK034 December   2024 DAC121S101-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased
    4. 2.4 Test Configuration and Condition
  6. 3Total Ionizing Dose (RHA) Characterization Test Results
    1. 3.1 Total Ionizing Dose RHA Characterization Summary Results
      1. 3.1.1 VDD Current HDR
      2. 3.1.2 Power Down Current HDR
  7. 4Total Ionizing Dose HDR Report

2.4 Test Configuration and Condition

For HDR a step-stress test method was used to determine the TID hardness level and a single test method to determine HDR TID. Prior to and after testing, electrical test were performed on a given sample of parts to verify that the units are within specified data sheet electrical test limits. The RLAT 5 sample units were used at the 50-300 rad(Si)/s dose level with biased setup conditions and this is repeated for each wafer lot.

The tables below list the serialized samples used for RHA characterization.

Table 2-2 HDR = 171 rad(Si)/s Device Information
HDR = 171 rad(Si)/s
Total Samples: 5
Exposure Levels
30 krad(Si)
Biased
22-26