SLLA470A April 2020 – October 2020 TLIN1028S-Q1
The failure mode distribution estimation for TLIN10283S-Q1 and TLIN10285S-Q1 in Table 2-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Transmitter fail | 45% |
Receiver fail | 5% |
LDO fail | 20% |
Logic or IO cell fail | 10% |
Global power or state control fail | 20% |