SLLA502A October 2020 – December 2021 TCAN1042-Q1 , TCAN1042G-Q1 , TCAN1042GV-Q1 , TCAN1042H-Q1 , TCAN1042HG-Q1 , TCAN1042HGV-Q1 , TCAN1042HV-Q1 , TCAN1042V-Q1
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This document contains information for TCAN1042-Q1 and TCAN1042V-Q1 (as well as the TCAN1042H-Q1, TCAN1042G-Q1, TCAN1042HV-Q1, TCAN1042GV-Q1, TCAN1042HG-Q1 and TCAN1042HGV-Q1). These are Controller Area Network (CAN) transceivers in the SOIC (D) and VSON (DRB) packages to aid in a functional safety system design. Information provided are:
TCAN1042-Q1 and TCAN1042V-Q1 were developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides Functional Safety Failure In Time (FIT) rates for TCAN1042-Q1 and TCAN1042V-Q1 (as well as the TCAN1042H-Q1, TCAN1042G-Q1, TCAN1042HV-Q1, TCAN1042GV-Q1, TCAN1042HG-Q1 and TCAN1042HGV-Q1) based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 8-pin SOIC (D) | FIT (Failures Per 109 Hours) 8-pin VSON (DRB) |
---|---|---|
Total Component FIT Rate | 12 | 6 |
Die FIT Rate | 4 | 2 |
Package FIT Rate | 8 | 4 |
The failure rate and mission profile information in Table 2-1 comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS, BICMOS ASICs Analog & Mixed =<50V supply | 20 FIT | 55C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for TCAN1042-Q1 and TCAN1042V-Q1 (as well as the TCAN1042H-Q1, TCAN1042G-Q1, TCAN1042HV-Q1, TCAN1042GV-Q1, TCAN1042HG-Q1 and TCAN1042HGV-Q1) in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Receiver fail | 45% |
Transmitter fail | 45% |
CANL or CANH driver stuck dominant | 5% |
Short circuitry any two pins | 5% |