SLUSDM0K May 2020 – June 2024 TPS628501-Q1 , TPS628502-Q1 , TPS628503-Q1
PRODMIX
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
SUPPLY | ||||||
IQ | Quiescent current | EN = VIN, no load, device not switching, MODE = GND, VOUT = 0.6 V | 17 | 36 | μA | |
ISD | Shutdown current | EN = GND, Nominal value at TJ = 25°C, Max value at TJ = 150°C | 1.5 | 48 | μA | |
VUVLO | Undervoltage lock out threshold | VIN rising | 2.45 | 2.6 | 2.7 | V |
VIN falling | 2.1 | 2.5 | 2.6 | V | ||
TJSD | Thermal shutdown threshold | TJ rising | 170 | °C | ||
Thermal shutdown hysteresis | TJ falling | 15 | °C | |||
CONTROL and INTERFACE | ||||||
VEN,IH | Input threshold voltage at EN, rising edge | 1.05 | 1.1 | 1.15 | V | |
VEN,IL | Input threshold voltage at EN, falling edge | 0.96 | 1.0 | 1.05 | V | |
VIH | High-level input-threshold voltage at MODE/SYNC | 1.1 | V | |||
IEN,LKG | Input leakage current into EN | VIH = VIN or VIL = GND | 125 | nA | ||
VIL | Low-level input-threshold voltage at MODE/SYNC | 0.3 | V | |||
ILKG | Input leakage current into MODE/SYNC | 100 | nA | |||
tDelay | Enable delay time | Time from EN high to device starts switching; VIN applied already | 135 | 200 | 520 | µs |
tDelay | Enable delay time | Time from EN high to device starts switching; VIN applied already, VIN ≥ 3.3 V |
480 | µs | ||
tRamp | Output voltage ramp time | Time from device starts switching to power good; device not in current limit | 0.8 | 1.3 | 1.8 | ms |
tRamp | Output voltage ramp time | Time from device starts switching to power good; device not in current limit | 90 | 150 | 210 | µs |
fSYNC | Frequency range on MODE/SYNC pin for synchronization | 1.8 | 4 | MHz | ||
Duty cycle of synchronization signal at MODE/SYNC | 20 | 80 | % | |||
Time to lock to external frequency | 50 | µs | ||||
resistance from COMP/FSET to GND for logic low | internal frequency setting with f = 2.25 MHz |
0 | 2.5 | kΩ | ||
Voltage on COMP/FSET for logic high | internal frequency setting with f = 2.25 MHz |
VIN | V | |||
VTH_PG | UVP power good threshold voltage; DC level |
rising (%VFB) | 92 | 95 | 98 | % |
VTH_PG | UVP power good threshold voltage; DC level |
falling (%VFB) | 87 | 90 | 93 | % |
VTH_PG | OVP power good threshold voltage; DC level |
rising (%VFB) | 107 | 110 | 113 | % |
OVP power good threshold voltage; DC level |
falling (%VFB) | 104 | 107 | 111 | % | |
VPG,OL | Low-level output voltage at PG | ISINK_PG = 2 mA | 0.07 | 0.3 | V | |
IPG,LKG | Input leakage current into PG | VPG = 5 V | 100 | nA | ||
tPG | PG deglitch time | for a high level to low level transition on the power good output | 40 | µs | ||
OUTPUT | ||||||
VFB | Feedback voltage, adjustable version | 0.6 | V | |||
VFB | Feedback voltage, fixed voltage versions | for TPS62850108 | 1.1 | V | ||
VFB | Feedback voltage, fixed voltage versions | for TPS6285018A | 1.2 | V | ||
VFB | Feedback voltage, fixed voltage versions | for TPS6285010M, TPS6285020M | 1.8 | V | ||
VFB | Feedback voltage, fixed voltage versions | for TPS6285021H | 3.3 | V | ||
IFB,LKG | Input leakage current into FB, adjustable version | VFB = 0.6 V | 1 | 70 | nA | |
IFB,LKG | Input leakage current into FB, fixed voltage versions | 1 | nA | |||
VFB | Feedback voltage accuracy | PWM, VIN ≥ VOUT + 1 V | -1 | 1 | % | |
VFB | Feedback voltage accuracy | PFM, VIN ≥ VOUT + 1 V, VOUT ≥ 1.0 V, Co,eff ≥ 10 µF, L = 0.47µH | -1 | 2 | % | |
VFB | Feedback voltage accuracy | PFM, VIN ≥ VOUT + 1 V, VOUT < 1.0 V, Co,eff ≥ 15 µF, L = 0.47µH |
-1 | 3 | % | |
Load regulation | PWM | 0.05 | %/A | |||
Line regulation | PWM, IOUT = 1 A, VIN ≥ VOUT + 1 V | 0.02 | %/V | |||
RDIS | Output discharge resistance | 100 | Ω | |||
fSW | PWM Switching frequency range | MODE = high, see the FSET pin functionality about setting the switching frequency | 1.8 | 2.25 | 4 | MHz |
fSW | PWM Switching frequency range | MODE = low, see the FSET pin functionality about setting the switching frequency | 1.8 | 3.5 | MHz | |
fSW | PWM Switching frequency | with COMP/FSET tied to GND or VIN | 2.025 | 2.25 | 2.475 | MHz |
fSW | PWM Switching frequency tolerance | using a resistor from COMP/FSET to GND | -12 | 12 | % | |
ton,min | Minimum on-time of high-side FET | VIN ≥ 3.3 V, TJ = -40°C to 125°C | 35 | 50 | ns | |
ton,min | Minimum on-time of low-side FET | 10 | ns | |||
RDS(ON) | High-side FET on-resistance | VIN ≥ 5 V |
65 | 120 | mΩ | |
Low-side FET on-resistance | VIN ≥ 5 V | 33 | 70 | mΩ | ||
High-side MOSFET leakage current | TJ = 85°C | 2.5 | µA | |||
High-side MOSFET leakage current | 0.01 | 44 | µA | |||
Low-side MOSFET leakage current | TJ = 85°C | 3.7 | µA | |||
Low-side MOSFET leakage current | 0.01 | 70 | µA | |||
SW leakage | V(SW) = 0.6V, current into SW pin | -0.05 | 11 | µA | ||
ILIMH | High-side FET switch current limit | DC value, for TPS628503; VIN = 3.3 V to 6 |
3.45 | 4.5 | 5.1 | A |
ILIMH | High-side FET switch current limit | DC value, for TPS628502; VIN = 3 V to 6 V |
2.85 | 3.4 | 3.9 | A |
ILIMH | High-side FET switch current limit | DC value, for TPS628501; VIN = 3 V to 6 V |
2.1 | 2.6 | 3.0 | A |
ILIMNEG | Low-side FET negative current limit | DC value | -1.8 | A |