SLUSDQ4 Data sheet

SLUSDQ4 April 2019 BQ79606A-Q1

PRODUCTION DATA.

7.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted) ⁽¹⁾

		MIN	MAX	UNIT
BAT, LDOIN to AVSS⁽²⁾		–0.3	36	V
BAT, LDOIN to AVSS	BAT, LDOIN to AVSS	–0.3	33	V
VC0 to AVSS	VC0 to AVSS	–0.3	5	V
VCn to AVSS (n=1 to 2)	VC_n to AVSS (n=1 to 2)	–0.3	33	V
VCn to AVSS (n=3 to 6)	VC_n to AVSS (n=3 to 6)	3	33	V
CBn to AVSS (n=1 to 6)	CB_nto AVSS (n=1 to 6)	-0.3	33	V
CBn to AVSS (n=0)		-0.3	5	V
COMHP, COMHN, COMLP, COMLN, FAULTHP, FAULTHN, FAULTLP, FAULTLN to CVSS		-20	20	V
COMHP to COMHN, COMLP to COMLN, FAULTHP to FAULTHN, FAULTLP to FAULTLN		-5.5	5.5	V
VC(n) to VC(n–1) for n = 1 to 6		-33	33	V
CB(n) to CB(n–1) for n = 1 to 6		–0.3	16	V
GPIO*, NFAULT, RX, TX, WAKEUP to AVSS		–0.3	V_VIO+0.3	V
VPROG to AVSS, during OTP programming		–0.3	7.9	V
VPROG to AVSS, OTP programming disabled		–0.3	8	V
AVDD, CVDD, REF1, TSREF, VIO, VLDO to AVSS		–0.3	6	V
DVDD to DVSS		–0.3	2.3	V
DVSS, CVSS to AVSS		–0.3	0.3	V
CB* current			175	mA
GPIO*, RX, TX current			10	mA
Ambient temperature		–40	125	°C
Junction temperature		–40	150	°C
Storage temperature, T_stg			150	°C

(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2) Specified for voltage spikes less than 100µs in duration for a maximum cumulative lifetime of 1000hours above 33 V.