SLUUCS3 February 2023 LM2105
The EVM is developed in such a way that the LM2105 driver performance can be evaluated and compared to data sheet parameters, or externally connected to power devices with provisions for source and sink gate-resistance flexibility. The LM2105 evaluation board uses surface-mount test points allowing connection to INL, INH, GVDD, and BST inputs. A variety of other test points are available for probing the LM2105. The input bias is configured such that the BST-SH high-side bias can be sourced from GVDD, or an external additional bias can be added to provide BST-SH directly. The high- and low-side driver output returns are separated on SH and GND respectively to allow evaluation of the LM2105 SH negative voltage capabilities.