SLVK099B March   2022  – September 2023 TPS7H5001-SP , TPS7H5002-SP , TPS7H5003-SP , TPS7H5004-SP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 System Level Implications
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References
  16.   C Revision History

7.1 Single-Event Latch-Up (SEL) Results

During the SEL testing the device was heated to 125°C by using a TDH35P10R0JE discrete power resistor soldered right under the thermal vias on the bottom layer on the coupon card board. Using a PXIe-4113 SMU, a current of 1.2 A was forced into the power resistor elevating the die temperature to 125°C. The temperature of the die was verified using thermal camera.

The ion species used for the SEL testing was Holmium (165Ho at 15 MeV/nucleon). For 165Ho ion, only the incident angle was used for an LETEFF = 75 MeV·cm2/mg (for more details, see Section 5). Flux of approximately 105 ions/cm2·s and a fluence of approximately 107 ions/cm2 per run was used. Run duration to achieve this fluence was approximately 2 minutes. The six devices (three for TPS7H5001-SP and one each for TPS7H5002/3/4-SP) were powered up and exposed to the heavy-ions using the maximum recommended voltage of 14 V. No SEL events were observed during all three runs, indicating that the TPS7H500X-SP is SEL-free up to 75 MeV·cm2/mg. Table 8-4 shows the SEL test conditions and results. Figure 7-1 shows a plot of the current vs time for run #1.

Table 7-1 Summary of TPS7H500X-SP SEL Test Condition and Results
Run # Device Unit # Ion LETEFF (MeV·cm2/mg) Flux (ions·cm2/mg) Fluence (ions·cm2/mg) SEL Events
1 TPS7H5001 1 Ho 75 1.19 × 105 1 × 107 0
2 TPS7H5001 2 Ho 75 7.26 × 104 1 × 107 0
3 TPS7H5001 3 Ho 75 1.41 × 105 9.97 × 106 0
73 TPS7H5002 9 Ho 75 1.12 × 105 9.97 × 106 0
74 TPS7H5003 10 Ho 75 1.06 × 105 9.95 × 106 0
75 TPS7H5004 11 Ho 75 1.09 × 105 1 × 107 0
Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations and combining (or summing) the fluences of the three runs (TPS7H5001-SP ) at 125°C (3 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEL ≤ 1.23 × 10–7 cm2/ device for LETEFF = 75 MeV·cm2/mg and T = 125°C.

GUID-20220119-SS0I-9SMQ-8L6P-LLRVVMD8LJZL-low.png Figure 7-1 Current vs Time for Run #1 of the TPS7H5001-SP at T = 125°C