SLVK099B March   2022  – September 2023 TPS7H5001-SP , TPS7H5002-SP , TPS7H5003-SP , TPS7H5004-SP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 System Level Implications
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References
  16.   C Revision History

10 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TPS7H500x-SP series of PWM controllers. Heavy-ions with LETEFF = 30 to 75 MeV·cm2/mg were were used for the SEE characterization campaign. Flux of 7.26 × 104 to 1.65 × 105 ions/cm2·s and fluences ranging from 9.96 × 106 to 1.01 × 107 ions/cm2 per run were used for the characterization. The SEE results demonstrated that the TPS7H5001-SP is free of destructive SEL, SEB, and cross conduction up to LETEFF = 75 MeV·cm2/mg and across the full electrical specifications. Transients at LETEFF = 30 to 75 MeV·cm2/mg on OUTX, SRX, VLDO, REFCAP, SS, COMP, and VOUT are presented and discussed. CREME96-based worst-week event-rate calculations for LEO(ISS) and GEO orbits for the DSEE and SET (at VIN= 12 V and FSW= 500 KHz) are presented for reference.