SLVK158A November   2023  – June 2024 TPS7H6003-SP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References
  15.   B Revision History

B Revision History

Changes from Revision * (November 2023) to Revision A (June 2024)

  • Updated Abstract to include the TPS7H6013-SP and TPS7H6023-SP informationGo
  • Updated TPS7H6003-SP to TPS7H60x3-SP when generically referencing the family of variantsGo
  • Updated Introduction to include the TPS7H6013-SP and TPS7H6023-SP informationGo
  • Updated Table 1-1 to include the TPS7H6013-SP and TPS7H6023-SP informationGo
  • Updated Table 6-1 to include ASW instrument informationGo
  • Updated Table 7-1 with TPS7H6013-SP and TPS7H6023-SP dataGo
  • Updated Table 7-2 with TPS7H6013-SP and TPS7H6023-SP dataGo
  • Updated Table 8-2 with TPS7H6013-SP and TPS7H6023-SP dataGo
  • Updated Event Rate Calculations to show that numbers reflect TPS7H6003-SPGo