SLVK174 September   2024 TPS7H1121-SP

 

  1.   1
  2.   TPS7H1121-SP Single-Event Effects (SEE)
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects (SEE)
  6. Device and Test Board Information
    1. 3.1 Device and Test Board Information Continued
  7. Irradiation Facility and Setup
  8. Depth, Range, and LETEFF Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. Single-Event Transients (SET)
  12. Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

Single-Event Latch-up (SEL) Results

During the SEL characterization, the device was heated using the load (0.6V case) or with external heat (13.3V case). When using external heat, the device was heated to 125°C by a cool-touch heat gun controlled by a Variac at MSU and a Closed-Loop PID controlled heat gun (MISTRAL 6 System (120V, 2400W) at TAMU. The temperature of the die was verified using FLIR IR camera prior to exposure to heavy ions.

The species used for SEL testing were Thulium (169Tm at 20MeV/nucleon, MSU facility) and Holmium (165Ho at 15 MeV/nucleon, TAMU facility). For both ions an incident angle of 0° was used to achieve an LETEFF = 75 MeV·cm2/mg (for more details refer to Ion LETEFF, Depth, and Range in Silicon). The kinetic energy in the vacuum for 169Tm is 3.431 GeV and 165Ho is 2.474 GeV. Flux of 5.90 x 104 to 9.99 x 104 ions/cm2 ·s and a fluence of approximately 107 ions/cm2 per run was used. Run duration to achieve this fluence was between 2-4 minutes. The six units were powered up and exposed to the heavy-ions using the maximum recommended input voltage of 14V. No SEL events were observed during all six runs, indicating that the TPS7H1121-SP is SEL-free up to 75 MeV·cm2/mg. Table 8-4 shows the SEL test conditions and results. Figure 7-1 and Figure 7-1 show plots of the current vs time for runs #1 and #3.

Table 7-1 Summary of TPS7H1121-SP SEL Test Condition and Results
Run # Unit #

Facility

Ion LETEFF (MeV·cm2/mg) Flux (ions·cm2/mg) Fluence (# ions)

VOUT

IOUT (A)

SEL (# Events)

1 1

MSU

169Tm

75

9.99 x 104

1 x 107

13.3

2

0

2 2

MSU

169Tm

75

9.81 x 104

1 x 107

13.3

2

0

3 3

MSU

169Tm

75

9.99 x 104

1 x 107

0.6

0.35

0

4

4

MSU

169Tm

75

9.99 x 104

1 x 107

0.6

0.35

0

5

5

TAMU

165Ho

75

5.92 x 104 1 x 107

13.3

2

0

6

6

TAMU

165Ho

75

5.90 x 104 1 x 107

0.6

0.56

0

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluences of the six runs at 125°C (6 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEL ≤ 6.15 x 10-8 cm2/device for LETEFF = 75 MeV·cm2/mg and T = 125°C.

 SEL Current Versus Time for
                    Run #1 of the TPS7H1121-SP at T = 125°C (VOUT = 13.3V) Figure 7-1 SEL Current Versus Time for Run #1 of the TPS7H1121-SP at T = 125°C (VOUT = 13.3V)
 SEL Current Versus Time for Run #3 of the TPS7H1121-SP at T = 125°C
                        (VOUT = 0.6V) Figure 7-2 SEL Current Versus Time for Run #3 of the TPS7H1121-SP at T = 125°C (VOUT = 0.6V)