SLVK174 September   2024 TPS7H1121-SP

 

  1.   1
  2.   TPS7H1121-SP Single-Event Effects (SEE)
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
    1. 3.1 Device and Test Board Information Continued
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

8 Single-Event Transients (SET)

SETs are defined as heavy-ion induced transients on VOUT, PG, or SS of the TPS7H1121-SP.

Testing was performed at room temperature (no external temperature control applied). The heavy-ion species used for SET testing were Thulium (169Tm at 20.3 MeV/nucleon, MSU facility) and Holmium (165Ho at 15 MeV/nucleon, TAMU facility). For both ions an incident angle of 0° was used to achieve an LETEFF = 75 MeV·cm2/mg, for more details refer to Ion LETEFF, Depth, and Range in Silicon. A flux of 6.34 x 104 to 1.05 x 105 ions/cm2·s and fluence of 107 ions/cm2 per run were used for the SET characterization discussed in this chapter. Over the course of testing three devices, not a single transient or SEFI was recorded on any of the monitored signals indicating that the TPS7H1121-SP is SET/SEFI free up to LETEFF = 75 MeV·cm2/mg.

Waveform size, sample rate, trigger type, value, and signal for all scopes used is presented on Table 8-1.

Table 8-1 Scope Settings

Scope Model

Trigger Signal

Trigger Type

Trigger Value

Record Length

Sample Rate

PXIe-5172 (1)

VOUT

 Window ±3%

100k

100MS/s

PXIe-5172 (2)

PG

 Edge/Negative 0.5V

below nominal

100k

10MS/s
PXIe-5172 (3)

SS

 Edge/Negative 20%

100k

 10MS/s

Table 8-2 Summary of TPS7H1121-SP SET Test Condition and Results
Run # Unit #

Facility

 Ion LETEFF (MeV·cm2/mg)

VIN (V)

 Flux (ions·cm2/mg) Fluence (# ions) PXIe-5172 VOUT # ≥ 3% PXIe-5172 PG#

PXIe-5172 SS #

19

7

MSU

 169Tm

75

5

 1.04 × 105 1.00 × 107

0

0

0

20

12

 9.78 × 104 1.00 × 107

0

0

0

21

8

MSU

169Tm

75

5

 9.71 × 104 1.00 × 107

0

0

0

22

12

 1.05 × 105 1.00 × 107

0

0

0

23

9

TAMU

 165Ho

75

5

6.39 × 104

 1.00 × 107

0

0

0

24

12

6.34 × 104

 1.00 × 107

0

0

0