SLVK174 September 2024 TPS7H1121-SP
SETs are defined as heavy-ion induced transients on VOUT, PG, or SS of the TPS7H1121-SP.
Testing was performed at room temperature (no external temperature control applied). The heavy-ion species used for SET testing were Thulium (169Tm at 20.3 MeV/nucleon, MSU facility) and Holmium (165Ho at 15 MeV/nucleon, TAMU facility). For both ions an incident angle of 0° was used to achieve an LETEFF = 75 MeV·cm2/mg, for more details refer to Ion LETEFF, Depth, and Range in Silicon. A flux of 6.34 x 104 to 1.05 x 105 ions/cm2·s and fluence of 107 ions/cm2 per run were used for the SET characterization discussed in this chapter. Over the course of testing three devices, not a single transient or SEFI was recorded on any of the monitored signals indicating that the TPS7H1121-SP is SET/SEFI free up to LETEFF = 75 MeV·cm2/mg.
Waveform size, sample rate, trigger type, value, and signal for all scopes used is presented on Table 8-1.
Scope Model |
Trigger Signal |
Trigger Type |
Trigger Value |
Record Length |
Sample Rate |
---|---|---|---|---|---|
PXIe-5172 (1) |
VOUT |
Window | ±3% |
100k |
100MS/s |
PXIe-5172 (2) |
PG |
Edge/Negative | 0.5V below nominal |
100k |
10MS/s |
PXIe-5172 (3) |
SS |
Edge/Negative | 20% |
100k |
10MS/s |
Run # | Unit # |
Facility |
Ion | LETEFF (MeV·cm2/mg) |
VIN (V) |
Flux (ions·cm2/mg) | Fluence (# ions) | PXIe-5172 VOUT # ≥ 3% | PXIe-5172 PG# |
PXIe-5172 SS # |
---|---|---|---|---|---|---|---|---|---|---|
19 |
7 |
MSU |
169Tm |
75 |
5 |
1.04 × 105 | 1.00 × 107 |
0 |
0 |
0 |
20 |
12 |
9.78 × 104 | 1.00 × 107 |
0 |
0 |
0 |
||||
21 |
8 |
MSU |
169Tm |
75 |
5 |
9.71 × 104 | 1.00 × 107 |
0 |
0 |
0 |
22 |
12 |
1.05 × 105 | 1.00 × 107 |
0 |
0 |
0 |
||||
23 |
9 |
TAMU |
165Ho |
75 |
5 |
6.39 × 104 |
1.00 × 107 |
0 |
0 |
0 |
24 |
12 |
6.34 × 104 |
1.00 × 107 |
0 |
0 |
0 |