SLVK182 December   2024 DRV8351-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix: HDR TID Report Data
  9. 6Appendix: ELDRS TID Report Data

1.1 Device Details

Table 1-1 lists the device information used for TID HDR characterization and qualification.

Table 1-1 Device and Exposure Details
TID HDR Details: up to 50 krad(Si)
TI Device NumberDRV8351-SEP
Package20-pin PW (TSSOP)
TechnologyLBC9
Die Lot Number3305394 (DMOS6)
A/T Lot Number and Date Code4076947, 2405 (MLA)
Quantity Tested25 irradiated devices + five control
Lot Accept or RejectDevices passed 30krad(Si)
HDR Radiation FacilityTexas Instruments CLAB in Dallas, Texas
HDR Dose Level10krad(Si), 20krad(Si), 30krad(Si), 40krad(si),

50krad(si)

HDR Dose Rate177.47 -rad(Si) /s ionizing radiation
HDR Radiation SourceGammacell 220 Excel (GC-220E) Co-60
Irradiation TemperatureAmbient, room temperature