SLVSH31A December   2023  – October 2024 TPS65224-Q1

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Device and Documentation Support
    1. 4.1 Device Support
      1. 4.1.1 Device Nomenclature
    2. 4.2 Receiving Notification of Documentation Updates
    3. 4.3 Support Resources
    4. 4.4 Third-Party Products Disclaimer
    5. 4.5 Trademarks
    6. 4.6 Electrostatic Discharge Caution
    7. 4.7 Glossary
  6. 5Revision History
  7. 6Mechanical, Packaging, and Orderable Information

Device Nomenclature

The following acronyms and terms are used in this data sheet. For a detailed list of terms, acronyms, and definitions, see the TI glossary.

    ABIST Analog Built-In Self-Test
    ADC Analog-to-Digital Converter
    AVS Adaptive Voltage Scaling
    BIST Built-In Self-Test
    CRC Cyclic Redundancy Check
    DAC Digital-to-Analog Converter
    DCR DC Resistance of an inductor
    DVS Dynamic Voltage Scaling
    EMC Electromagnetic Compatibility
    ESM Error Signal Monitor
    ESR Equivalent Series Resistance
    FSD First Supply Detection
    GPIO General-Purpose Input and Output
    I2C Inter-Integrated Circuit
    LDO Low-Dropout voltage linear regulator
    NA Not Applicable
    MCU Micro Controller Unit
    NVM Non-Volatile Memory
    OPN Orderable Part Number
    OTP One Time Programmable
    OV Overvoltage
    OVP Overvoltage Protection
    PD Pull-Down
    PDN Power Delivery Network
    PFM Pulse Frequency Modulation
    PFSM Pre-configured Finite State Machine
    PGOOD Power Good (signal which indicates that the monitored power supply rail is in range)
    PLL Phase Locked Loop
    PMIC Power-Management Integrated Circuit
    POR Power On Reset
    PU Pull-Up
    PP Push-Pull
    PSRR Power Supply Rejection Ratio
    PWM Pulse Width Modulation
    SoC System on Chip
    SPI Serial Peripheral Interface
    TSD Thermal Shut-Down
    UV Undervoltage
    UVLO Undervoltage Lockout
    VMON Voltage Monitor