SLVUD40 November   2024 TPS25984B

 

  1.   1
  2.   TPS25984BEVM: Evaluation Module for TPS25984B eFuse
  3.   Trademarks
  4. 1Introduction
    1. 1.1 EVM Features
    2. 1.2 EVM Applications
  5. 2Description
  6. 3Schematic
  7. 4General Configurations
    1. 4.1 Physical Access
    2. 4.2 Test Equipment
      1. 4.2.1 Power Supplies
      2. 4.2.2 Meters
      3. 4.2.3 Oscilloscope
      4. 4.2.4 Loads
  8. 5Test Setup and Procedures
    1. 5.1  Hot Plug
    2. 5.2  Start-Up With Enable
    3. 5.3  Difference Between Current Limit and DVDT Based Start-Up Mechanisms
    4. 5.4  Power Up Into Short
    5. 5.5  Overvoltage Lockout
    6. 5.6  Transient Overload Performance
    7. 5.7  Overcurrent Event
    8. 5.8  Output Hot Short
    9. 5.9  Quick Output Discharge (QOD)
    10. 5.10 Thermal Performance of TPS25984BEVM
  9. 6EVAL Board Assembly Drawings and Layout Guidelines
    1. 6.1 PCB Drawings
  10. 7Bill of Materials (BOM)

1 Introduction

The TPS25984BEVM eFuse evaluation board allows reference circuit evaluation of Texas Instruments (TI) TPS25984B eFuse. The TPS25984B device is a 4.5V to 16V and 70A (peak) stack-able eFuse with accurate and fast current monitor. This device supports parallel connection of multiple eFuses for higher current designs by actively synchronizing the device states and sharing the loads during start-up and steady-state. The TPS25984B eFuse has an integrated FET with ultra-low ON resistance of 0.8mΩ, adjustable and robust overcurrent and short-circuit protections, precise load current monitoring, fast overvoltage protection (fixed 16.7V threshold), adjustable output slew rate control for inrush current protection, and over-temperature protection to verify FET SOA. The TPS25984B eFuse also has fixed overcurrent transient blanking timer to support load transients, adjustable undervoltage protection, integrated FET health monitoring and reporting, analog die temperature monitor output, and dedicated fault and power good indication pins.