2 Test Setup

The LMK04832-SEP was monitored for SEL and SEFI, using EIA JESD57 ⁽⁵⁾ as a test guide.

The device under test (DUT) was soldered to a custom evaluation board similar to the LMK04832SEPEVM evaluation board ⁽⁶⁾. The DUT was decapped to expose the die surface to the ion beam. The active components on the board were bypassed and the power and input signals to the DUT were supplied externally.

Power to the DUT board was supplied by an Agilent 6702 quad supply. The 6702 was controlled and the output current to the DUT board was monitored by an NI-PXIe-8135 controller using a custom LabVIEW™ GUI (PXI Rad Test) developed by Texas Instruments for SEE testing. The voltage was set to 3.45 V as measured at the DUT board.

The DUT was configured with both PLLs enabled. There was a 122.88-MHz signal on PLL1 and a 1.024-MHz signal on PLL2. The internal VCO frequency was set at 2949.12 MHz. All clock outputs were enabled but were configured to different output modes (LVPECL, LVDS, HSDS, CML, and LCPECL) with different dividers and delays so that different functions are tested.

CLKout8 output was monitored with the output in LVDS mode with a Tektronix DPO7354 oscilloscope.