SNAK022 May   2024 LMX1860-SEP

 

  1.   1
  2.   LMX1860-SEP Single-Event Effects Test Report
  3.   Trademarks
  4. 1Product Description
  5. 2Test Setup
    1. 2.1 SEL Test
    2. 2.2 SEFI Test
    3. 2.3 Test Facility
  6. 3Results
    1. 3.1 SEL Results
    2. 3.2 SEFI Results
  7. 4Summary
  8. 5References

Test Facility

Heavy ion irradiation testing was performed at the Berkeley Accelerator Space Effects (BASE) Facility at the Lawrence Berkeley National Lab (LBNL), using the 16AMeV cocktail with the DUT board in air (5).

The effective linear energy transfer (LETeff) of each ion was calculated at the silicon surface of the die using the SEUSS GUI from Texas A&M University(6). The calculations were based on the 2mil Mylar window used at LBNL and the metal and passivation stack above the silicon on the die. All ion runs were greater than 43MeV-cm2/ mg, but different ions were used.

Three ion runs were done with the junction temperature of the DUT at 125°C, with a total effective fluence of 1.96 × 107 ions / cm2 and one ion run was done at ambient temperature with the DUT junction temperature at 41°C to an effective fluence of 1 × 107 ions / cm2.