SNLA466A August   2024  – October 2024 DP83822I , DP83826E , DP83826I , DP83867E , DP83867IR , DP83869HM

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Abbreviation
  5. 2Introduction
  6. 3EMC Emission
    1. 3.1 Radiated Emission
      1. 3.1.1 Test Setup for Radiated Emission Test
      2. 3.1.2 Main Radiated Emission Sources
    2. 3.2 Conducted Emission
      1. 3.2.1 Test Setup for Conducted Emission Test
      2. 3.2.2 Main Conducted Emission Sources
    3. 3.3 Debug Procedure on EMC Emission
      1. 3.3.1 General Debug Procedure
      2. 3.3.2 RE Specific Debug
      3. 3.3.3 CE Specific Debug
  7. 4EMC Immunity Test
    1. 4.1 EMI Passing Criteria
    2. 4.2 Common EMI Knowledge
    3. 4.3 IEC61000 4-2 ESD
      1. 4.3.1 ESD Test Setup
      2. 4.3.2 Possible Root Cause of Failure
      3. 4.3.3 Debug Procedure
        1. 4.3.3.1 Follow the Test Setup
        2. 4.3.3.2 Remove External Factors on Cable or Link Partner
        3. 4.3.3.3 Areas to Explore to Improve ESD Performance
          1. 4.3.3.3.1 Air or Capacitive Coupling Discharge ESD Recommendations
          2. 4.3.3.3.2 Direct Contact Discharge ESD Recommendation
        4. 4.3.3.4 Schematic and Layout Recommendations
    4. 4.4 IEC 61000 4-3 RI
      1. 4.4.1 RI Test Setup
      2. 4.4.2 Possible Root Cause of Failure
      3. 4.4.3 Debug Procedure
        1. 4.4.3.1 Follow RI Test Setup
        2. 4.4.3.2 Remove External Factor on Cable or Link Partner
        3. 4.4.3.3 Found out Main Emission Area
        4. 4.4.3.4 Schematic and Layout Recommendation
    5. 4.5 IEC 61000 4-4 EFT
      1. 4.5.1 EFT Test Setup
      2. 4.5.2 Possible Root Cause of Failure
      3. 4.5.3 Debug Procedure
        1. 4.5.3.1 Follow EFT Test Setup
        2. 4.5.3.2 Remove External Factor on Cable or Link Parnter
        3. 4.5.3.3 Areas to Explore to Improve EFT Performance
        4. 4.5.3.4 Schematic and Layout Recommendation
    6. 4.6 IEC 61000 4-5 Surge
      1. 4.6.1 Surge Test Setup
      2. 4.6.2 Possible Root Cause of Failure
      3. 4.6.3 Debug Procedure
        1. 4.6.3.1 Follow Surge Test Setup
        2. 4.6.3.2 Remove External Factor on Cable or Link Partner
        3. 4.6.3.3 Area to Explore to Improve Surge Performance
        4. 4.6.3.4 Schematic and Layout Recommendation
    7. 4.7 IEC 61000 4-6 CI
      1. 4.7.1 CI Test Setup
      2. 4.7.2 Possible Root Cause of Failure
      3. 4.7.3 Debug Procedure
        1. 4.7.3.1 Follow CI Test Setup
        2. 4.7.3.2 Remove External Factors on Cable or Link Partner
        3. 4.7.3.3 Areas to Explore to Improve CI Performance
        4. 4.7.3.4 Schematic and Layout Recommendation
  8. 5Schematic and Layout Recommendation for All EMC, EMI Tests
    1. 5.1 Schematic Recommendation
    2. 5.2 Layout Recommendation
  9. 6Summary
  10. 7References
  11. 8Revision History

4.7 IEC 61000 4-6 CI

The IEC 61000 4-6 is also known as Conducted Immunity Testing. Conducted immunity refers to a electrical device’s ability to resist unwanted RF disturbance voltages and currents that get coupled through external wires. The main source of disturbance comes from electromagnetic fields due to equipment with RF transmission, with this disturbance injected into the Coupling Decoupling Network (CDN) and flowing to the Ethernet cable. Unlike ESD and EFT tests, most of the noise are flow through the shield and directly to connector ground. CI testing involves electromagnetic noise injected directly into the cable communication lines to disturb the system. Therefore, both the common mode and differential mode impedance of the device are crucial for CI testing. In CI testing, the disturbance has the frequency range of 9kHz to 80MHz with 80% Amplitude modulation at 1kHz.

CI test level:

  • Level 1: 1Vrms
  • Level 2: 3Vrms
  • Level 3: 10Vrms

Note: Class A, Class B, and Class C depend on the customer’s requirements. For the Class A requirement, customers typically look for no link drop as opposed to no consecutive packet errors, as CI testing involves static constant high frequency noise injection. Most of the packet errors occur at the same time and frequency range (most likely on communication frequency)