SNOA961A February 2017 – February 2023 LDC2112 , LDC2114 , LDC3114 , LDC3114-Q1
For reliable inductive touch applications, the INn traces should not have significant time-varying capacitance shifts. Parasitic capacitance shifts could produce false button press events if the INn traces are not shielded. TI recommends to surround the INn traces with a shield driven by the COM pin (see #T4726003-62).