SNOAA48A December   2019  – November 2024 LM4040-N-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 Functional Safety Failure In Time (FIT) Rates for Voltage Options ≤ 5V
    2. 2.2 Functional Safety Failure In Time (FIT) Rates for 8.192V Voltage Option
    3. 2.3 Functional Safety Failure In Time (FIT) Rates for 10V Voltage Option
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
  7. 5Revision History

1 Overview

This document contains information for the LM4040-N-Q1 (SOT-23 package) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

LM4040-N-Q1 Functional Block DiagramFigure 1-1 Functional Block Diagram

The LM4040-N-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.