SNOK010 November   2024 TPS7H6005-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

7.1 Single-Event Latch-up (SEL) Results

During the SEL testing the device was heated to 125°C by using a Closed-Loop PID controlled heat gun (MISTRAL 6 System (120V, 2400W) at TAMU or a cool-touch heat gun powered by a variac at MSU. The temperature of the die was verified using thermal camera prior to exposure to heavy ions.

The species used for the SEL testing was Xenon (129Xe at 25MeV/nucleon) at MSU or Silver (109Ag at 15MeV/nucleon) at TAMU. An angle of incidence of 0° was used to achieve an LETEFF = 50.5MeV×cm2/mg or 48MeV×cm2/mg respectively (for more details, see Ion LETEFF, Depth, and Range in Silicon). The kinetic energy in the vacuum for this ions is 3.225 GeV or 1.634GeV respectively. Flux of approximately 105 ions / cm2×s and a fluence of approximately 107 ions/cm2 per run was used. Run duration to achieve this fluence was approximately two minutes. The twelve devices were powered up and exposed to the heavy-ions using the maximum recommended input voltage and boot voltage of 14V. The ASW (High-Side Driver Signal Return) was set to 14, 45, or 150V with respect to AGND (low-side driver signal return) depending on the variant being tested. The device was set in both PWM and IIM modes during testing. For more information see Single-Event Effects section. No SEL events were observed during all fourteen runs, indicating that the TPS7H60x5-SEP is SEL-free up to 50.5MeV×cm2/mg. Table 8-4 shows the SEL test conditions and results. Figure 7-1 shows a plot of the current versus time for run 1.

Table 7-1 Summary of TPS7H60x5-SEP SEL Test Condition and Results
Run Number Unit Number Variant Ion LETEFF (MeV × cm2 / mg) Flux (ions × cm2 / mg) Fluence (Number of ions) VIN VBOOT Mode EN/HI PWM/LI SEL (# Events)
1 1 TPS7H6005 129Xe 50.5 9.54 × 104 1 × 107 14 14 PWM 14VDC 14Vpk-pk 500kHz 0
2 1 TPS7H6005 129Xe 50.5 8.80 × 104 1 × 107 14 14 PWM 14VDC 14Vpk-pk 1MHz 0
3 1 TPS7H6005 129Xe 50.5 8.65 × 104 1 × 107 14 14 PWM 14VDC 14Vpk-pk 2MHz 0
4 2 TPS7H6005 129Xe 50.5 1.02 × 105 1 × 107 14 14 IIMENSW 14Vpk-pk 500kHz 14Vpk-pk 500kHz 0
5

3

 TPS7H6005 129Xe 50.5 9.94 × 104 1 × 107 14 14 IIMDISSW 14Vpk-pk 500kHz 14Vpk-pk 500kHz 0
6

4

 TPS7H6015 129Xe 50.5 1.1 × 105 1 × 107 14 14 PWM 14VDC 14Vpk-pk 500kHz 0
7

5

 TPS7H6015 129Xe 50.5 9.79 × 104 1 × 107 14 14 IIMENSW 14Vpk-pk 500kHz 14Vpk-pk 500 kHz 0
8

6

 TPS7H6015 129Xe 50.5 1 × 105 1 × 107 14 14 IIMDISSW 14Vpk-pk 500kHz 14Vpk-pk 500kHz 0
9

7

 TPS7H6025 129Xe 50.5 1.02 × 105 1 × 107 14 14 PWM 14VDC 14Vpk-pk 500kHz 0

10

8

 TPS7H6025 129Xe

50.5

 1.09 × 105 1 × 107 14 14 IIMENSW 14Vpk-pk 500kHz 14Vpk-pk 500kHz 0
11

9

 TPS7H6005 109Ag 48 1.04 × 105 1 × 107 14 14 PWM 14VDC 14Vpk-pk 500kHz 0
12

10

 TPS7H6015 109Ag

48

 1.06 × 105 1 × 107 14 14 PWM 14VDC 14Vpk-pk 500kHz 0
13

11

 TPS7H6025 109Ag 48 1.06 × 105 1 × 107 14 14 PWM 14VDC 14Vpk-pk 500kHz 0
14 12 TPS7H6025 109Ag 48 1.05 × 105 1 × 107 14 14 IIMDISSW 14Vpk-pk 500kHz 14Vpk-pk 500kHz 0

Using the MFTF method shown in Single-Event Effects (SEE) Confidence Interval Calculations and combining (or summing) the fluences of the four runs at 125°C (14 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:

Equation 1. σ S E L ≤   2.63   x   10 - 8   c m 2 / d e v i c e   f o r   L E T E F F   =   50 . 5   M e V · c m 2 / m g   a n d   T   =   125 ° C
SEL Run 1 (PWM Mode, fsw = 500kHz) Figure 7-1 SEL Run 1 (PWM Mode, fsw = 500kHz)
SEL Run 2 (PWM Mode, fsw = 1MHz) Figure 7-2 SEL Run 2 (PWM Mode, fsw = 1MHz)
SEL Run 3 (PWM Mode, fsw = 2MHz) Figure 7-3 SEL Run 3 (PWM Mode, fsw = 2MHz)
SEL Run 4 (IIM Enabled Mode, fsw = 500kHz) Figure 7-4 SEL Run 4 (IIM Enabled Mode, fsw = 500kHz)
SEL Run 5 (IIM Disabled Mode, fsw = 500kHz) Figure 7-5 SEL Run 5 (IIM Disabled Mode, fsw = 500kHz)