SNOU206 October   2024 LMG2640

 

  1.   1
  2.   Description
  3.   Features
  4.   Applications
  5.   5
  6. 1Evaluation Module Overview
    1. 1.1 Introduction
    2. 1.2 Kit Contents
    3. 1.3 Specification
    4. 1.4 Device Information
    5. 1.5 General TI High Voltage Evaluation User Safety Guidelines
      1. 1.5.1 Safety and Precautions
  7. 2Hardware
    1. 2.1 LMG2640EVM-090 Daughter Card
      1. 2.1.1 Test Points
      2. 2.1.2 Integrated Current Sensing
      3. 2.1.3 Enable Pin
      4. 2.1.4 FAULT
      5. 2.1.5 Power Pins
      6. 2.1.6 Heat Sink
    2. 2.2 Motherboard
      1. 2.2.1 Bias Supply
      2. 2.2.2 PWM Input
      3. 2.2.3 Fault Protection
    3. 2.3 Recommended Footprint
    4. 2.4 Test Equipment
    5. 2.5 Test Procedure When Paired With LMG342X-BB-EVM
      1. 2.5.1 Setup
      2. 2.5.2 Start-Up and Operating Procedure
      3. 2.5.3 Test Results
      4. 2.5.4 Shutdown Procedure
      5. 2.5.5 Additional Operating Notes
  8. 3Hardware Design Files
    1. 3.1 LMG2640EVM-090 Schematic
    2. 3.2 Motherboard Schematic
    3. 3.3 PCB Layout
    4. 3.4 Bill of Materials
  9. 4Additional Information
    1. 4.1 Trademarks
  10. 5Related Documentation

2.1.1 Test Points

There are multiple test points on the LMG2640EVM-090 daughter card designed for analog and digital measurements with an oscilloscope. For a full list, refer to Table 2-1. Digital test points such as Fault, PWM, EN, and CS test points can be used to debug a system and understand how the device operates. However, note that the high signal ringing is expected. Long traces route these test points for easy measuring, but introduce parasitics that appear as high frequency noise during switching transitions. The test points are designed for observation only, and are useful for functional debugging with this daughter card.