SNVA912A January 2020 – April 2021 REF34-Q1

4 Pin Failure Mode Analysis (Pin FMA)

This section provides a Failure Mode Analysis (FMA) for the pins of the REF34-Q1 (DBV-6, DBV-5 and DGK-8 packages). The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Pin short-circuited to Ground (see Table 4-2, Table 4-6 and Table 4-10)
Pin open-circuited (seeTable 4-3, Table 4-7 and Table 4-11)
Pin short-circuited to an adjacent pin (see Table 4-4, Table 4-8 and Table 4-12)
Pin short-circuited to supply (see Table 4-5, Table 4-9 and Table 4-13)

Table 4-2 through Table 4-13 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects

Class	Failure Effects
A	Potential device damage that affects functionality
B	No device damage, but loss of functionality
C	No device damage, but performance degradation
D	No device damage, no impact to functionality or performance

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

10uF capacitor connected to Vout
1uF capacitor connected to Vin