SPRAD06B March   2022  – November 2024 AM620-Q1 , AM623 , AM625 , AM625-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
    1. 1.1 Board Designs Supported
    2. 1.2 General Board Layout Guidelines
    3. 1.3 PCB Stack-Up
    4. 1.4 Bypass Capacitors
      1. 1.4.1 Bulk Bypass Capacitors
      2. 1.4.2 High-Speed Bypass Capacitors
      3. 1.4.3 Return Current Bypass Capacitors
    5. 1.5 Velocity Compensation
  5. 2DDR4 Board Design and Layout Guidance
    1. 2.1  DDR4 Introduction
    2. 2.2  DDR4 Device Implementations Supported
    3. 2.3  DDR4 Interface Schematics
      1. 2.3.1 DDR4 Implementation Using 16-Bit SDRAM Devices
      2. 2.3.2 DDR4 Implementation Using 8-Bit SDRAM Devices
    4. 2.4  Compatible JEDEC DDR4 Devices
    5. 2.5  Placement
    6. 2.6  DDR4 Keepout Region
    7. 2.7  DBI
    8. 2.8  VPP
    9. 2.9  Net Classes
    10. 2.10 DDR4 Signal Termination
    11. 2.11 VREF Routing
    12. 2.12 VTT
    13. 2.13 POD Interconnect
    14. 2.14 CK and ADDR_CTRL Topologies and Routing Guidance
    15. 2.15 Data Group Topologies and Routing Guidance
    16. 2.16 CK and ADDR_CTRL Routing Specification
      1. 2.16.1 CACLM - Clock Address Control Longest Manhattan Distance
      2. 2.16.2 CK and ADDR_CTRL Routing Limits
    17. 2.17 Data Group Routing Specification
      1. 2.17.1 DQLM - DQ Longest Manhattan Distance
      2. 2.17.2 Data Group Routing Limits
    18. 2.18 Bit Swapping
      1. 2.18.1 Data Bit Swapping
      2. 2.18.2 Address and Control Bit Swapping
  6. 3LPDDR4 Board Design and Layout Guidance
    1. 3.1  LPDDR4 Introduction
    2. 3.2  LPDDR4 Device Implementations Supported
    3. 3.3  LPDDR4 Interface Schematics
    4. 3.4  Compatible JEDEC LPDDR4 Devices
    5. 3.5  Placement
    6. 3.6  LPDDR4 Keepout Region
    7. 3.7  LPDDR4 DBI
    8. 3.8  Net Classes
    9. 3.9  LPDDR4 Signal Termination
    10. 3.10 LPDDR4 VREF Routing
    11. 3.11 LPDDR4 VTT
    12. 3.12 CK0 and ADDR_CTRL Topologies
    13. 3.13 Data Group Topologies
    14. 3.14 CK0 and ADDR_CTRL Routing Specification
    15. 3.15 Data Group Routing Specification
    16. 3.16 Byte and Bit Swapping
  7. 4LPDDR4 Board Design Simulations
    1. 4.1 Board Model Extraction
    2. 4.2 Board-Model Validation
    3. 4.3 S-Parameter Inspection
    4. 4.4 Time Domain Reflectometry (TDR) Analysis
    5. 4.5 System Level Simulation
      1. 4.5.1 Simulation Setup
      2. 4.5.2 Simulation Parameters
      3. 4.5.3 Simulation Targets
        1. 4.5.3.1 Eye Quality
        2. 4.5.3.2 Delay Report
        3. 4.5.3.3 Mask Report
    6. 4.6 Design Example
      1. 4.6.1 Stack-Up
      2. 4.6.2 Routing
      3. 4.6.3 Model Verification
      4. 4.6.4 Simulation Results
  8. 5Appendix: AM62x ALW and AMC Package Delays
  9. 6Revision History

Simulation Results

The simulation results are provided for the LPDDR4 interface from a 10 layer design. These simulation targets must be met to ensure the design will operate at the desired level of performance.

CA simulations need to be verified at the DRAM pin/BGA. This includes:

  • Vix_CK ratio (JEDEC)
  • Jitter/noise margins with respect to the eye mask (JEDEC)
  • Peak-peak power noise
 LPDDR4 Simulation Results for
                    CA Figure 4-10 LPDDR4 Simulation Results for CA

Data write simulations need to be verified at both the DRAM BGA pin and the DRAM pad. This includes:

  • Vix_CK ration (JEDEC)
  • Jitter/noise margins with respect to the eye mask (JEDEC)
  • Peak-peak power noise
 LPDDR4 Simulation Results for
                    Write Figure 4-11 LPDDR4 Simulation Results for Write

Data read simulations need to be verified at SOC. This includes:

  • Jitter/noise margins with respect to the eye mask
  • Peak-peak power noise
 LPDDR4 Simulation Results for
                    Read Figure 4-12 LPDDR4 Simulation Results for Read

The simulations results for read includes two sets for data, black and green. The black shows the design failed, as several bytes failed to meet the eye margins. The green is the simulation results of the same design, but with back-drilling the via stubs applied.